Optimizing an apparatus for multi-stage processing of product units

A method of optimizing an apparatus for multi-stage processing of product units such as wafers, the method includes: receiving object data representing one or more parameters measured across the product units and associated with different stages of processing of the product units; and determining fi...

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Bibliographische Detailangaben
Hauptverfasser: Grouwstra, Cédric Désiré, Ypma, Alexander, Gkorou, Dimitra, Tsirogiannis, Georgios, Nije, Jelle, Spiering, Frans Reinier, Chen, Tzu-Chao, Roy, Sarathi, Van Wijk, Robert Jan
Format: Patent
Sprache:eng
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