Information processing device, information processing method and non-transitory computer readable medium

According to one embodiment, an information processing device includes an anomaly detector and an integration unit. The anomaly detector is configured to estimate a degree of drift anomaly based on measured values of a sensor during a sub-period which is a part of a monitored period. The integration...

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Hauptverfasser: Ishii, Gaku, Moriyama, Takuro
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creator Ishii, Gaku
Moriyama, Takuro
description According to one embodiment, an information processing device includes an anomaly detector and an integration unit. The anomaly detector is configured to estimate a degree of drift anomaly based on measured values of a sensor during a sub-period which is a part of a monitored period. The integration unit is configured to estimate the degree of drift anomaly accumulated within the monitored period based on the estimated degrees of drift anomaly accumulated within the sub-periods. Symptoms of a drift anomaly include mismatches between the actual values and measured values.
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US11118947B2</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US11118947B2</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US11118947B23</originalsourceid><addsrcrecordid>eNqNirsOwjAMALswIOAfzE4HHhJlBYFgBubKJC611NiRkyLx93RgZOCWG-7GRXuRRi1gZhWIpo5SYnmCpxc7WgD_zoFyqx5QPIhKmQ0lcVZ7g9MQ-0wGRujx0dHweu7DtBg12CWafT0p5qfj7XAuKWpNKaIjoVzfr8uBarfZ7lfrf54PsRxBsA</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Information processing device, information processing method and non-transitory computer readable medium</title><source>esp@cenet</source><creator>Ishii, Gaku ; Moriyama, Takuro</creator><creatorcontrib>Ishii, Gaku ; Moriyama, Takuro</creatorcontrib><description>According to one embodiment, an information processing device includes an anomaly detector and an integration unit. The anomaly detector is configured to estimate a degree of drift anomaly based on measured values of a sensor during a sub-period which is a part of a monitored period. The integration unit is configured to estimate the degree of drift anomaly accumulated within the monitored period based on the estimated degrees of drift anomaly accumulated within the sub-periods. Symptoms of a drift anomaly include mismatches between the actual values and measured values.</description><language>eng</language><subject>ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS ; CALCULATING ; COMPUTING ; COUNTING ; ELECTRIC DIGITAL DATA PROCESSING ; MEASURING ; MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE ; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR ; PHYSICS ; TARIFF METERING APPARATUS ; TESTING</subject><creationdate>2021</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20210914&amp;DB=EPODOC&amp;CC=US&amp;NR=11118947B2$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20210914&amp;DB=EPODOC&amp;CC=US&amp;NR=11118947B2$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Ishii, Gaku</creatorcontrib><creatorcontrib>Moriyama, Takuro</creatorcontrib><title>Information processing device, information processing method and non-transitory computer readable medium</title><description>According to one embodiment, an information processing device includes an anomaly detector and an integration unit. The anomaly detector is configured to estimate a degree of drift anomaly based on measured values of a sensor during a sub-period which is a part of a monitored period. The integration unit is configured to estimate the degree of drift anomaly accumulated within the monitored period based on the estimated degrees of drift anomaly accumulated within the sub-periods. Symptoms of a drift anomaly include mismatches between the actual values and measured values.</description><subject>ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS</subject><subject>CALCULATING</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>ELECTRIC DIGITAL DATA PROCESSING</subject><subject>MEASURING</subject><subject>MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE</subject><subject>MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR</subject><subject>PHYSICS</subject><subject>TARIFF METERING APPARATUS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2021</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNirsOwjAMALswIOAfzE4HHhJlBYFgBubKJC611NiRkyLx93RgZOCWG-7GRXuRRi1gZhWIpo5SYnmCpxc7WgD_zoFyqx5QPIhKmQ0lcVZ7g9MQ-0wGRujx0dHweu7DtBg12CWafT0p5qfj7XAuKWpNKaIjoVzfr8uBarfZ7lfrf54PsRxBsA</recordid><startdate>20210914</startdate><enddate>20210914</enddate><creator>Ishii, Gaku</creator><creator>Moriyama, Takuro</creator><scope>EVB</scope></search><sort><creationdate>20210914</creationdate><title>Information processing device, information processing method and non-transitory computer readable medium</title><author>Ishii, Gaku ; Moriyama, Takuro</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US11118947B23</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2021</creationdate><topic>ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS</topic><topic>CALCULATING</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>ELECTRIC DIGITAL DATA PROCESSING</topic><topic>MEASURING</topic><topic>MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE</topic><topic>MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR</topic><topic>PHYSICS</topic><topic>TARIFF METERING APPARATUS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>Ishii, Gaku</creatorcontrib><creatorcontrib>Moriyama, Takuro</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Ishii, Gaku</au><au>Moriyama, Takuro</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Information processing device, information processing method and non-transitory computer readable medium</title><date>2021-09-14</date><risdate>2021</risdate><abstract>According to one embodiment, an information processing device includes an anomaly detector and an integration unit. The anomaly detector is configured to estimate a degree of drift anomaly based on measured values of a sensor during a sub-period which is a part of a monitored period. The integration unit is configured to estimate the degree of drift anomaly accumulated within the monitored period based on the estimated degrees of drift anomaly accumulated within the sub-periods. Symptoms of a drift anomaly include mismatches between the actual values and measured values.</abstract><oa>free_for_read</oa></addata></record>
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subjects ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS
CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
MEASURING
MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE
MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
PHYSICS
TARIFF METERING APPARATUS
TESTING
title Information processing device, information processing method and non-transitory computer readable medium
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