Systems and methods for menu directed inspection

A non-destructive testing (NDT) system can provide a tree model of an inspection on a display of an NDT device and on a web page configured in a web browser on a computing device coupled to the NDT device. Inspection data acquired using the NDT device can be provided in real-time as the inspection d...

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Hauptverfasser: Britton, Thomas D, Maule, Bryan David, Jana, Ritwick, Domke, Michael Christopher, Lockhart, Robert Scott
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creator Britton, Thomas D
Maule, Bryan David
Jana, Ritwick
Domke, Michael Christopher
Lockhart, Robert Scott
description A non-destructive testing (NDT) system can provide a tree model of an inspection on a display of an NDT device and on a web page configured in a web browser on a computing device coupled to the NDT device. Inspection data acquired using the NDT device can be provided in real-time as the inspection data is associated with a node configured in the tree model. The NDT system can generate an inspection tree model based on an inspection template including a template tree model. Defect properties, inspection instructions, and/or image transforms can be applied to nodes of the template tree model such that the generated inspection tree model includes the applied defect properties, inspection instructions, and/or image transforms, which can then be applied to the inspection data acquired at the inspection point location corresponding to each node.
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US11113806B2</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US11113806B2</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US11113806B23</originalsourceid><addsrcrecordid>eNrjZDAIriwuSc0tVkjMS1HITS3JyE8pVkjLLwKy80oVUjKLUpNLUlMUMvOKC4CszPw8HgbWtMSc4lReKM3NoOjmGuLsoZtakB-fWlyQmJyal1oSHxpsCATGFgZmTkbGxKgBAHKKK5A</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Systems and methods for menu directed inspection</title><source>esp@cenet</source><creator>Britton, Thomas D ; Maule, Bryan David ; Jana, Ritwick ; Domke, Michael Christopher ; Lockhart, Robert Scott</creator><creatorcontrib>Britton, Thomas D ; Maule, Bryan David ; Jana, Ritwick ; Domke, Michael Christopher ; Lockhart, Robert Scott</creatorcontrib><description>A non-destructive testing (NDT) system can provide a tree model of an inspection on a display of an NDT device and on a web page configured in a web browser on a computing device coupled to the NDT device. Inspection data acquired using the NDT device can be provided in real-time as the inspection data is associated with a node configured in the tree model. The NDT system can generate an inspection tree model based on an inspection template including a template tree model. Defect properties, inspection instructions, and/or image transforms can be applied to nodes of the template tree model such that the generated inspection tree model includes the applied defect properties, inspection instructions, and/or image transforms, which can then be applied to the inspection data acquired at the inspection point location corresponding to each node.</description><language>eng</language><subject>CALCULATING ; COMPUTING ; COUNTING ; ELECTRIC DIGITAL DATA PROCESSING ; IMAGE DATA PROCESSING OR GENERATION, IN GENERAL ; PHYSICS</subject><creationdate>2021</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20210907&amp;DB=EPODOC&amp;CC=US&amp;NR=11113806B2$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20210907&amp;DB=EPODOC&amp;CC=US&amp;NR=11113806B2$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Britton, Thomas D</creatorcontrib><creatorcontrib>Maule, Bryan David</creatorcontrib><creatorcontrib>Jana, Ritwick</creatorcontrib><creatorcontrib>Domke, Michael Christopher</creatorcontrib><creatorcontrib>Lockhart, Robert Scott</creatorcontrib><title>Systems and methods for menu directed inspection</title><description>A non-destructive testing (NDT) system can provide a tree model of an inspection on a display of an NDT device and on a web page configured in a web browser on a computing device coupled to the NDT device. Inspection data acquired using the NDT device can be provided in real-time as the inspection data is associated with a node configured in the tree model. The NDT system can generate an inspection tree model based on an inspection template including a template tree model. Defect properties, inspection instructions, and/or image transforms can be applied to nodes of the template tree model such that the generated inspection tree model includes the applied defect properties, inspection instructions, and/or image transforms, which can then be applied to the inspection data acquired at the inspection point location corresponding to each node.</description><subject>CALCULATING</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>ELECTRIC DIGITAL DATA PROCESSING</subject><subject>IMAGE DATA PROCESSING OR GENERATION, IN GENERAL</subject><subject>PHYSICS</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2021</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZDAIriwuSc0tVkjMS1HITS3JyE8pVkjLLwKy80oVUjKLUpNLUlMUMvOKC4CszPw8HgbWtMSc4lReKM3NoOjmGuLsoZtakB-fWlyQmJyal1oSHxpsCATGFgZmTkbGxKgBAHKKK5A</recordid><startdate>20210907</startdate><enddate>20210907</enddate><creator>Britton, Thomas D</creator><creator>Maule, Bryan David</creator><creator>Jana, Ritwick</creator><creator>Domke, Michael Christopher</creator><creator>Lockhart, Robert Scott</creator><scope>EVB</scope></search><sort><creationdate>20210907</creationdate><title>Systems and methods for menu directed inspection</title><author>Britton, Thomas D ; Maule, Bryan David ; Jana, Ritwick ; Domke, Michael Christopher ; Lockhart, Robert Scott</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US11113806B23</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2021</creationdate><topic>CALCULATING</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>ELECTRIC DIGITAL DATA PROCESSING</topic><topic>IMAGE DATA PROCESSING OR GENERATION, IN GENERAL</topic><topic>PHYSICS</topic><toplevel>online_resources</toplevel><creatorcontrib>Britton, Thomas D</creatorcontrib><creatorcontrib>Maule, Bryan David</creatorcontrib><creatorcontrib>Jana, Ritwick</creatorcontrib><creatorcontrib>Domke, Michael Christopher</creatorcontrib><creatorcontrib>Lockhart, Robert Scott</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Britton, Thomas D</au><au>Maule, Bryan David</au><au>Jana, Ritwick</au><au>Domke, Michael Christopher</au><au>Lockhart, Robert Scott</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Systems and methods for menu directed inspection</title><date>2021-09-07</date><risdate>2021</risdate><abstract>A non-destructive testing (NDT) system can provide a tree model of an inspection on a display of an NDT device and on a web page configured in a web browser on a computing device coupled to the NDT device. Inspection data acquired using the NDT device can be provided in real-time as the inspection data is associated with a node configured in the tree model. The NDT system can generate an inspection tree model based on an inspection template including a template tree model. Defect properties, inspection instructions, and/or image transforms can be applied to nodes of the template tree model such that the generated inspection tree model includes the applied defect properties, inspection instructions, and/or image transforms, which can then be applied to the inspection data acquired at the inspection point location corresponding to each node.</abstract><oa>free_for_read</oa></addata></record>
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subjects CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
PHYSICS
title Systems and methods for menu directed inspection
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-07T06%3A30%3A23IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=Britton,%20Thomas%20D&rft.date=2021-09-07&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS11113806B2%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true