Optical positioning system and operating method thereof
There is provided an operating method of an optical positioning system including: capturing an image frame of a detected surface, which has interleaved bright regions and dark regions, using a field of view and a shutter time of an optical sensor counting a number of edge pairs between the bright re...
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| creator | Chan, Ching-Geak Liew, Tong-Sen Leong, Keen-Hun |
| description | There is provided an operating method of an optical positioning system including: capturing an image frame of a detected surface, which has interleaved bright regions and dark regions, using a field of view and a shutter time of an optical sensor counting a number of edge pairs between the bright regions and the dark regions that the field of view passes; calculating an average value of the image frame; calculating a ratio between the calculated average value and the shutter time; determining that the field of view is aligned with one of the dark regions when the ratio is smaller than a ratio threshold; and determining that the field of view is aligned with one of the bright regions when the ratio is larger than the ratio threshold. |
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calculating an average value of the image frame; calculating a ratio between the calculated average value and the shutter time; determining that the field of view is aligned with one of the dark regions when the ratio is smaller than a ratio threshold; and determining that the field of view is aligned with one of the bright regions when the ratio is larger than the ratio threshold.</description><language>eng</language><subject>ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS ; CALCULATING ; COMPUTING ; COUNTING ; ELECTRIC DIGITAL DATA PROCESSING ; MEASURING ; MEASURING ANGLES ; MEASURING AREAS ; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS ; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS ; MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE ; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR ; PHYSICS ; TARIFF METERING APPARATUS ; TESTING</subject><creationdate>2021</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20210831&DB=EPODOC&CC=US&NR=11105608B2$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76289</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20210831&DB=EPODOC&CC=US&NR=11105608B2$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Chan, Ching-Geak</creatorcontrib><creatorcontrib>Liew, Tong-Sen</creatorcontrib><creatorcontrib>Leong, Keen-Hun</creatorcontrib><title>Optical positioning system and operating method thereof</title><description>There is provided an operating method of an optical positioning system including: capturing an image frame of a detected surface, which has interleaved bright regions and dark regions, using a field of view and a shutter time of an optical sensor counting a number of edge pairs between the bright regions and the dark regions that the field of view passes; 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calculating an average value of the image frame; calculating a ratio between the calculated average value and the shutter time; determining that the field of view is aligned with one of the dark regions when the ratio is smaller than a ratio threshold; and determining that the field of view is aligned with one of the bright regions when the ratio is larger than the ratio threshold.</abstract><oa>free_for_read</oa></addata></record> |
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| subjects | ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR PHYSICS TARIFF METERING APPARATUS TESTING |
| title | Optical positioning system and operating method thereof |
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