Maintaining a set of process fingerprints

A method of maintaining a set of fingerprints representing variation of one or more process parameters across wafers subjected to a device manufacturing method, the method including: receiving measurement data of one or more parameters measured on wafers; updating the set of fingerprints based on an...

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Bibliographische Detailangaben
Hauptverfasser: Ypma, Alexander, Cekli, Hakki Ergün, Tsirogiannis, Georgios, Nije, Jelle, Bastani, Vahid, Sonntag, Dag, Van Wijk, Robert Jan
Format: Patent
Sprache:eng
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