Scanning unit for scanning an angular scale and angle-measuring device having such a scanning unit

A scanning unit for an angle-measuring device for scanning an angular scale, so that a relative angular position between the scanning unit and the angular scale about an axis of rotation can be determined, includes a substrate having a first surface, a detector configured to generate signals which a...

Ausführliche Beschreibung

Bibliographische Detailangaben

1. Verfasser:	Eder, Peter
Format:	Patent
Sprache:	eng
Schlagworte:	ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS MEASURING MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR PHYSICS TARIFF METERING APPARATUS TESTING
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