Fourier spectroscopic analyzer
A Fourier spectroscopic analyzer includes: a light receiver that receives a first wavelength component of a first wavelength band and a second wavelength component of a second wavelength band different from the first wavelength band, emits an interferogram to a sample, and outputs a first light rece...
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| creator | Namatame, Tetsushi Nishi, Masashi Nakamura, Yukihiro Suzuki, Yasuyuki |
| description | A Fourier spectroscopic analyzer includes: a light receiver that receives a first wavelength component of a first wavelength band and a second wavelength component of a second wavelength band different from the first wavelength band, emits an interferogram to a sample, and outputs a first light reception signal acquired by receiving the first wavelength component and a second light reception signal acquired by receiving the second wavelength component; and a signal processing device that eliminates noise of the first wavelength component and acquires the spectrum by Fourier transform processing using the first light reception signal and the second light reception signal. The first wavelength band is a wavelength band of which a spectrum is acquired among wavelength components included in light that has passed through the sample. The interferogram is interference light and the sample is an analysis target. |
| format | Patent |
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The first wavelength band is a wavelength band of which a spectrum is acquired among wavelength components included in light that has passed through the sample. 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The first wavelength band is a wavelength band of which a spectrum is acquired among wavelength components included in light that has passed through the sample. The interferogram is interference light and the sample is an analysis target.</description><subject>COLORIMETRY</subject><subject>MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT</subject><subject>MEASURING</subject><subject>MEASURING ANGLES</subject><subject>MEASURING AREAS</subject><subject>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</subject><subject>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</subject><subject>PHYSICS</subject><subject>RADIATION PYROMETRY</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2021</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZJBzyy8tykwtUiguSE0uKcovTs4vyExWSMxLzKmsSi3iYWBNS8wpTuWF0twMim6uIc4euqkF-fGpxQWJyal5qSXxocGGhgbmxiZGJk5GxsSoAQAzgyUo</recordid><startdate>20210727</startdate><enddate>20210727</enddate><creator>Namatame, Tetsushi</creator><creator>Nishi, Masashi</creator><creator>Nakamura, Yukihiro</creator><creator>Suzuki, Yasuyuki</creator><scope>EVB</scope></search><sort><creationdate>20210727</creationdate><title>Fourier spectroscopic analyzer</title><author>Namatame, Tetsushi ; Nishi, Masashi ; Nakamura, Yukihiro ; Suzuki, Yasuyuki</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US11073424B23</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2021</creationdate><topic>COLORIMETRY</topic><topic>MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT</topic><topic>MEASURING</topic><topic>MEASURING ANGLES</topic><topic>MEASURING AREAS</topic><topic>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</topic><topic>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</topic><topic>PHYSICS</topic><topic>RADIATION PYROMETRY</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>Namatame, Tetsushi</creatorcontrib><creatorcontrib>Nishi, Masashi</creatorcontrib><creatorcontrib>Nakamura, Yukihiro</creatorcontrib><creatorcontrib>Suzuki, Yasuyuki</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Namatame, Tetsushi</au><au>Nishi, Masashi</au><au>Nakamura, Yukihiro</au><au>Suzuki, Yasuyuki</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Fourier spectroscopic analyzer</title><date>2021-07-27</date><risdate>2021</risdate><abstract>A Fourier spectroscopic analyzer includes: a light receiver that receives a first wavelength component of a first wavelength band and a second wavelength component of a second wavelength band different from the first wavelength band, emits an interferogram to a sample, and outputs a first light reception signal acquired by receiving the first wavelength component and a second light reception signal acquired by receiving the second wavelength component; and a signal processing device that eliminates noise of the first wavelength component and acquires the spectrum by Fourier transform processing using the first light reception signal and the second light reception signal. The first wavelength band is a wavelength band of which a spectrum is acquired among wavelength components included in light that has passed through the sample. The interferogram is interference light and the sample is an analysis target.</abstract><oa>free_for_read</oa></addata></record> |
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| subjects | COLORIMETRY MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS RADIATION PYROMETRY TESTING |
| title | Fourier spectroscopic analyzer |
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