Built-in self-test for bit-write enabled memory arrays

A non-limiting example includes data storage circuitry. The data storage circuitry includes a built-in self-test (BIST) engine. The data storage circuitry includes a memory array including memory cells. The memory array is configured to store data based on a read-write vector associated with an addr...

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Bibliographische Detailangaben

Hauptverfasser:	Rodko, Daniel, Patel, Pradip, Hyde, Matthew Steven, Huott, William
Format:	Patent
Sprache:	eng
Schlagworte:	INFORMATION STORAGE PHYSICS STATIC STORES
Online-Zugang:	Volltext bestellen
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