Assessment system
An assessment system, including methods of and apparatus for producing a targeted assessment scheme comprising battery of tests or assessments and based on a plurality of requirements. Methods described include a method of producing an assessment scheme for assessing the suitability of a candidate,...
Gespeichert in:
| Hauptverfasser: | , , , , , , , , , |
|---|---|
| Format: | Patent |
| Sprache: | eng |
| Schlagworte: | |
| Online-Zugang: | Volltext bestellen |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | |
|---|---|
| container_issue | |
| container_start_page | |
| container_title | |
| container_volume | |
| creator | Lahti, Kenneth Kantrowitz, Tracy Grelle, Darrin McLellan, Richard Fleck, Steven Dawson, Craig Dekoekkoek, Paul Meyer, Jolene Facteau, Jeff Affourtit, Mathijs |
| description | An assessment system, including methods of and apparatus for producing a targeted assessment scheme comprising battery of tests or assessments and based on a plurality of requirements. Methods described include a method of producing an assessment scheme for assessing the suitability of a candidate, the method comprising: receiving as input from a user at least one candidate requirement and at least one candidate test identifier; constructing a candidate assessment comprising at least one test in dependence on the test identifier; analysing the candidate assessment in dependence on the requirement to predict the accuracy of the assessment in identifying a suitable candidate; and reporting on the predicted accuracy of the candidate assessment. |
| format | Patent |
| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US10956869B2</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US10956869B2</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US10956869B23</originalsourceid><addsrcrecordid>eNrjZBB0LC5OLS7OTc0rUSiuLC5JzeVhYE1LzClO5YXS3AyKbq4hzh66qQX58anFBYnJqXmpJfGhwYYGlqZmFmaWTkbGxKgBAPUaIC8</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Assessment system</title><source>esp@cenet</source><creator>Lahti, Kenneth ; Kantrowitz, Tracy ; Grelle, Darrin ; McLellan, Richard ; Fleck, Steven ; Dawson, Craig ; Dekoekkoek, Paul ; Meyer, Jolene ; Facteau, Jeff ; Affourtit, Mathijs</creator><creatorcontrib>Lahti, Kenneth ; Kantrowitz, Tracy ; Grelle, Darrin ; McLellan, Richard ; Fleck, Steven ; Dawson, Craig ; Dekoekkoek, Paul ; Meyer, Jolene ; Facteau, Jeff ; Affourtit, Mathijs</creatorcontrib><description>An assessment system, including methods of and apparatus for producing a targeted assessment scheme comprising battery of tests or assessments and based on a plurality of requirements. Methods described include a method of producing an assessment scheme for assessing the suitability of a candidate, the method comprising: receiving as input from a user at least one candidate requirement and at least one candidate test identifier; constructing a candidate assessment comprising at least one test in dependence on the test identifier; analysing the candidate assessment in dependence on the requirement to predict the accuracy of the assessment in identifying a suitable candidate; and reporting on the predicted accuracy of the candidate assessment.</description><language>eng</language><subject>CALCULATING ; COMPUTING ; COUNTING ; DATA PROCESSING SYSTEMS OR METHODS, SPECIALLY ADAPTED FORADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORYOR FORECASTING PURPOSES ; ELECTRIC DIGITAL DATA PROCESSING ; PHYSICS ; SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE,COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORY OR FORECASTINGPURPOSES, NOT OTHERWISE PROVIDED FOR</subject><creationdate>2021</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20210323&DB=EPODOC&CC=US&NR=10956869B2$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76289</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20210323&DB=EPODOC&CC=US&NR=10956869B2$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Lahti, Kenneth</creatorcontrib><creatorcontrib>Kantrowitz, Tracy</creatorcontrib><creatorcontrib>Grelle, Darrin</creatorcontrib><creatorcontrib>McLellan, Richard</creatorcontrib><creatorcontrib>Fleck, Steven</creatorcontrib><creatorcontrib>Dawson, Craig</creatorcontrib><creatorcontrib>Dekoekkoek, Paul</creatorcontrib><creatorcontrib>Meyer, Jolene</creatorcontrib><creatorcontrib>Facteau, Jeff</creatorcontrib><creatorcontrib>Affourtit, Mathijs</creatorcontrib><title>Assessment system</title><description>An assessment system, including methods of and apparatus for producing a targeted assessment scheme comprising battery of tests or assessments and based on a plurality of requirements. Methods described include a method of producing an assessment scheme for assessing the suitability of a candidate, the method comprising: receiving as input from a user at least one candidate requirement and at least one candidate test identifier; constructing a candidate assessment comprising at least one test in dependence on the test identifier; analysing the candidate assessment in dependence on the requirement to predict the accuracy of the assessment in identifying a suitable candidate; and reporting on the predicted accuracy of the candidate assessment.</description><subject>CALCULATING</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>DATA PROCESSING SYSTEMS OR METHODS, SPECIALLY ADAPTED FORADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORYOR FORECASTING PURPOSES</subject><subject>ELECTRIC DIGITAL DATA PROCESSING</subject><subject>PHYSICS</subject><subject>SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE,COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORY OR FORECASTINGPURPOSES, NOT OTHERWISE PROVIDED FOR</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2021</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZBB0LC5OLS7OTc0rUSiuLC5JzeVhYE1LzClO5YXS3AyKbq4hzh66qQX58anFBYnJqXmpJfGhwYYGlqZmFmaWTkbGxKgBAPUaIC8</recordid><startdate>20210323</startdate><enddate>20210323</enddate><creator>Lahti, Kenneth</creator><creator>Kantrowitz, Tracy</creator><creator>Grelle, Darrin</creator><creator>McLellan, Richard</creator><creator>Fleck, Steven</creator><creator>Dawson, Craig</creator><creator>Dekoekkoek, Paul</creator><creator>Meyer, Jolene</creator><creator>Facteau, Jeff</creator><creator>Affourtit, Mathijs</creator><scope>EVB</scope></search><sort><creationdate>20210323</creationdate><title>Assessment system</title><author>Lahti, Kenneth ; Kantrowitz, Tracy ; Grelle, Darrin ; McLellan, Richard ; Fleck, Steven ; Dawson, Craig ; Dekoekkoek, Paul ; Meyer, Jolene ; Facteau, Jeff ; Affourtit, Mathijs</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US10956869B23</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2021</creationdate><topic>CALCULATING</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>DATA PROCESSING SYSTEMS OR METHODS, SPECIALLY ADAPTED FORADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORYOR FORECASTING PURPOSES</topic><topic>ELECTRIC DIGITAL DATA PROCESSING</topic><topic>PHYSICS</topic><topic>SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE,COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORY OR FORECASTINGPURPOSES, NOT OTHERWISE PROVIDED FOR</topic><toplevel>online_resources</toplevel><creatorcontrib>Lahti, Kenneth</creatorcontrib><creatorcontrib>Kantrowitz, Tracy</creatorcontrib><creatorcontrib>Grelle, Darrin</creatorcontrib><creatorcontrib>McLellan, Richard</creatorcontrib><creatorcontrib>Fleck, Steven</creatorcontrib><creatorcontrib>Dawson, Craig</creatorcontrib><creatorcontrib>Dekoekkoek, Paul</creatorcontrib><creatorcontrib>Meyer, Jolene</creatorcontrib><creatorcontrib>Facteau, Jeff</creatorcontrib><creatorcontrib>Affourtit, Mathijs</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Lahti, Kenneth</au><au>Kantrowitz, Tracy</au><au>Grelle, Darrin</au><au>McLellan, Richard</au><au>Fleck, Steven</au><au>Dawson, Craig</au><au>Dekoekkoek, Paul</au><au>Meyer, Jolene</au><au>Facteau, Jeff</au><au>Affourtit, Mathijs</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Assessment system</title><date>2021-03-23</date><risdate>2021</risdate><abstract>An assessment system, including methods of and apparatus for producing a targeted assessment scheme comprising battery of tests or assessments and based on a plurality of requirements. Methods described include a method of producing an assessment scheme for assessing the suitability of a candidate, the method comprising: receiving as input from a user at least one candidate requirement and at least one candidate test identifier; constructing a candidate assessment comprising at least one test in dependence on the test identifier; analysing the candidate assessment in dependence on the requirement to predict the accuracy of the assessment in identifying a suitable candidate; and reporting on the predicted accuracy of the candidate assessment.</abstract><oa>free_for_read</oa></addata></record> |
| fulltext | fulltext_linktorsrc |
| identifier | |
| ispartof | |
| issn | |
| language | eng |
| recordid | cdi_epo_espacenet_US10956869B2 |
| source | esp@cenet |
| subjects | CALCULATING COMPUTING COUNTING DATA PROCESSING SYSTEMS OR METHODS, SPECIALLY ADAPTED FORADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORYOR FORECASTING PURPOSES ELECTRIC DIGITAL DATA PROCESSING PHYSICS SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE,COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORY OR FORECASTINGPURPOSES, NOT OTHERWISE PROVIDED FOR |
| title | Assessment system |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-04T13%3A32%3A34IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=Lahti,%20Kenneth&rft.date=2021-03-23&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS10956869B2%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |