Semiconductor device and a method of manufacturing the same

For simplifying the dual-damascene formation steps of a multilevel Cu interconnect, a formation step of an antireflective film below a photoresist film is omitted. Described specifically, an interlayer insulating film is dry etched with a photoresist film formed thereover as a mask, and interconnect...

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Bibliographische Detailangaben
Hauptverfasser: Sasahara, Kyoko, Hotta, Katsuhiko
Format: Patent
Sprache:eng
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