Method for measuring and dynamically modulating characteristics of slow light in photonic-crystal coupled-cavity waveguide

A method for measuring and dynamically modulating characteristics of slow light in a photonic-crystal coupled-cavity waveguide is set forth. A photonic-crystal structure consists of a series of microcavity components formed by arranging silicon dielectric rods in triangular lattice structure in the...

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Bibliographische Detailangaben
Hauptverfasser:	Li, Changhong, Yan, Chongqing, Fang, Yufan, Zhang, Nan, Wan, Yong
Format:	Patent
Sprache:	eng
Schlagworte:	BASIC ELECTRIC ELEMENTS ELECTRICITY MANUFACTURE OR TREATMENT OF NANOSTRUCTURES MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES NANOTECHNOLOGY OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS OPTICS PERFORMING OPERATIONS PHYSICS RESONATORS, LINES, OR OTHER DEVICES OF THE WAVEGUIDE TYPE SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES TRANSPORTING WAVEGUIDES
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Beschreibung
Zusammenfassung:	A method for measuring and dynamically modulating characteristics of slow light in a photonic-crystal coupled-cavity waveguide is set forth. A photonic-crystal structure consists of a series of microcavity components formed by arranging silicon dielectric rods in triangular lattice structure in the substrate of organic polymer polystyrene with an electro-optical effect, a light waveguide structure being along the X direction, and regularly removing single silicon dielectric rods. The present disclosure has the beneficial effects that extremely high slow light effect and high-performance all-optical buffer are realized.