Built-in self-test (BIST) circuit, memory device including the same, and method of operating the BIST circuit

A built-in self-test (BIST) circuit and a method of operating BIST circuit is disclosed. The BIST circuit is configured to generate a test pattern based on a plurality of test parameters including a first test parameter and a second test parameter and perform a test on at least one memory core. The...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Park, Ki-hyun, Ok, Seung-ho, Shin, Sang-hoon, Zhang, Pyung-moon, Park, Yong-sik
Format:	Patent
Sprache:	eng
Schlagworte:	INFORMATION STORAGE PHYSICS STATIC STORES
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!