Methods, systems, and computer program product for determining layout equivalence for a multi-fabric electronic design

Disclosed are methods, systems, and articles of manufacture for determining layout equivalence between a plurality of versions of a single layout of a multi-fabric electronic design. These techniques identify a first version and a second version of a layout of an electronic design that spans across...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: Tarroux, Gerard, Pic, Jean-Noel, Alasseur, Xavier, Ginetti, Arnold Jean Marie Gustave
Format: Patent
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator Tarroux, Gerard
Pic, Jean-Noel
Alasseur, Xavier
Ginetti, Arnold Jean Marie Gustave
description Disclosed are methods, systems, and articles of manufacture for determining layout equivalence between a plurality of versions of a single layout of a multi-fabric electronic design. These techniques identify a first version and a second version of a layout of an electronic design that spans across multiple design fabrics. One or more collaborative comparator modules are executed to determine whether the first version is identical to or different from the second version of the layout. These techniques further modify the first version or the second version of the layout with discrepancy annotation.
format Patent
fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US10783312B1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US10783312B1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US10783312B13</originalsourceid><addsrcrecordid>eNqNirEKwjAQQLs4iPoP527B2kFnRXFxUudyJtcaSHIxuRT691bxA5zeg_emRX8hebJOK0hDEnKjoNeg2IUsFCFE7iK6D3VWAi1H0DQWZ7zxHVgcOAvQK5seLXlF3wXBZSumbPERjQKypCSyH1VTMp2fF5MWbaLFj7NieTreDueSAjeUAiryJM39Wq23u7quNvuq_ud5A2pbRjY</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Methods, systems, and computer program product for determining layout equivalence for a multi-fabric electronic design</title><source>esp@cenet</source><creator>Tarroux, Gerard ; Pic, Jean-Noel ; Alasseur, Xavier ; Ginetti, Arnold Jean Marie Gustave</creator><creatorcontrib>Tarroux, Gerard ; Pic, Jean-Noel ; Alasseur, Xavier ; Ginetti, Arnold Jean Marie Gustave</creatorcontrib><description>Disclosed are methods, systems, and articles of manufacture for determining layout equivalence between a plurality of versions of a single layout of a multi-fabric electronic design. These techniques identify a first version and a second version of a layout of an electronic design that spans across multiple design fabrics. One or more collaborative comparator modules are executed to determine whether the first version is identical to or different from the second version of the layout. These techniques further modify the first version or the second version of the layout with discrepancy annotation.</description><language>eng</language><subject>CALCULATING ; COMPUTING ; COUNTING ; ELECTRIC DIGITAL DATA PROCESSING ; PHYSICS</subject><creationdate>2020</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20200922&amp;DB=EPODOC&amp;CC=US&amp;NR=10783312B1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25543,76294</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20200922&amp;DB=EPODOC&amp;CC=US&amp;NR=10783312B1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Tarroux, Gerard</creatorcontrib><creatorcontrib>Pic, Jean-Noel</creatorcontrib><creatorcontrib>Alasseur, Xavier</creatorcontrib><creatorcontrib>Ginetti, Arnold Jean Marie Gustave</creatorcontrib><title>Methods, systems, and computer program product for determining layout equivalence for a multi-fabric electronic design</title><description>Disclosed are methods, systems, and articles of manufacture for determining layout equivalence between a plurality of versions of a single layout of a multi-fabric electronic design. These techniques identify a first version and a second version of a layout of an electronic design that spans across multiple design fabrics. One or more collaborative comparator modules are executed to determine whether the first version is identical to or different from the second version of the layout. These techniques further modify the first version or the second version of the layout with discrepancy annotation.</description><subject>CALCULATING</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>ELECTRIC DIGITAL DATA PROCESSING</subject><subject>PHYSICS</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2020</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNirEKwjAQQLs4iPoP527B2kFnRXFxUudyJtcaSHIxuRT691bxA5zeg_emRX8hebJOK0hDEnKjoNeg2IUsFCFE7iK6D3VWAi1H0DQWZ7zxHVgcOAvQK5seLXlF3wXBZSumbPERjQKypCSyH1VTMp2fF5MWbaLFj7NieTreDueSAjeUAiryJM39Wq23u7quNvuq_ud5A2pbRjY</recordid><startdate>20200922</startdate><enddate>20200922</enddate><creator>Tarroux, Gerard</creator><creator>Pic, Jean-Noel</creator><creator>Alasseur, Xavier</creator><creator>Ginetti, Arnold Jean Marie Gustave</creator><scope>EVB</scope></search><sort><creationdate>20200922</creationdate><title>Methods, systems, and computer program product for determining layout equivalence for a multi-fabric electronic design</title><author>Tarroux, Gerard ; Pic, Jean-Noel ; Alasseur, Xavier ; Ginetti, Arnold Jean Marie Gustave</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US10783312B13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2020</creationdate><topic>CALCULATING</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>ELECTRIC DIGITAL DATA PROCESSING</topic><topic>PHYSICS</topic><toplevel>online_resources</toplevel><creatorcontrib>Tarroux, Gerard</creatorcontrib><creatorcontrib>Pic, Jean-Noel</creatorcontrib><creatorcontrib>Alasseur, Xavier</creatorcontrib><creatorcontrib>Ginetti, Arnold Jean Marie Gustave</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Tarroux, Gerard</au><au>Pic, Jean-Noel</au><au>Alasseur, Xavier</au><au>Ginetti, Arnold Jean Marie Gustave</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Methods, systems, and computer program product for determining layout equivalence for a multi-fabric electronic design</title><date>2020-09-22</date><risdate>2020</risdate><abstract>Disclosed are methods, systems, and articles of manufacture for determining layout equivalence between a plurality of versions of a single layout of a multi-fabric electronic design. These techniques identify a first version and a second version of a layout of an electronic design that spans across multiple design fabrics. One or more collaborative comparator modules are executed to determine whether the first version is identical to or different from the second version of the layout. These techniques further modify the first version or the second version of the layout with discrepancy annotation.</abstract><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language eng
recordid cdi_epo_espacenet_US10783312B1
source esp@cenet
subjects CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
PHYSICS
title Methods, systems, and computer program product for determining layout equivalence for a multi-fabric electronic design
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-23T05%3A19%3A13IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=Tarroux,%20Gerard&rft.date=2020-09-22&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS10783312B1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true