Multi-view planar near-field scattering tomography system

A multi-view planar near-field scattering tomography system is provided herein. In one aspect the system is developed based on the reformulated signal subspace approach. Utilized for solving the electromagnetic inverse scattering problem, the signal subspace approach is reformulated. The present inv...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Safavi-Naeini, Safieddin, Shahir, Shahed
Format:	Patent
Sprache:	eng
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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