Dynamically protective scan data control

Dynamically protective scan data control

A method of testing a device under test, the device under test comprising a scan chain having a number of storage elements. The method determines a representation of toggling events in a test sequence, where the test sequence is for testing the scan chain. The method also selectively times input of...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: Kawoosa, Mudasir Shafat, Parekhji, Rubin Ajit
Format: Patent
Sprache:eng
Schlagworte:
CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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Beschreibung
Zusammenfassung:A method of testing a device under test, the device under test comprising a scan chain having a number of storage elements. The method determines a representation of toggling events in a test sequence, where the test sequence is for testing the scan chain. The method also selectively times input of a bit sequence, corresponding to the test sequence, to a first storage element in the number of storage elements, and through the scan chain, in response to the determining step.