Logic built in self test circuitry for use in an integrated circuit with scan chains

Aspects include a system having logic built-in self-test (LBIST) circuitry for use in an integrated circuit with scan chains. The system includes a pattern generator configured for generating scan-in test values for said scan chains; a signature register configured for collecting scan-out responses...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Kusko, Mary P, Bhamidipati, Satya R. S, Gopalakrishnasetty, Raghu G, Lichtenau, Cedric
Format:	Patent
Sprache:	eng
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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