Modulated air surface particle detector

A device for counting particles on a sample surface includes a scanner probe having a first opening for receiving particles from a sample surface and one or more second openings, a particle detector for detecting particles passed there-through, a modulator for modulating air flowing there-through, a...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: Alston, William W, Browne, David, Lutz, Don
Format: Patent
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator Alston, William W
Browne, David
Lutz, Don
description A device for counting particles on a sample surface includes a scanner probe having a first opening for receiving particles from a sample surface and one or more second openings, a particle detector for detecting particles passed there-through, a modulator for modulating air flowing there-through, a pump for producing a first airstream flowing from the first opening and through the particle detector, and for producing a second airstream flowing through the modulator and to the one or more second openings, and control circuitry for controlling the modulator to modulate an amplitude of the second airstream.
format Patent
fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US10725061B2</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US10725061B2</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US10725061B23</originalsourceid><addsrcrecordid>eNrjZFD3zU8pzUksSU1RSMwsUiguLUpLTE5VKEgsKslMzklVSEktSU0uyS_iYWBNS8wpTuWF0twMim6uIc4euqkF-fGpxQVATXmpJfGhwYYG5kamBmaGTkbGxKgBAKsiKCA</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Modulated air surface particle detector</title><source>esp@cenet</source><creator>Alston, William W ; Browne, David ; Lutz, Don</creator><creatorcontrib>Alston, William W ; Browne, David ; Lutz, Don</creatorcontrib><description>A device for counting particles on a sample surface includes a scanner probe having a first opening for receiving particles from a sample surface and one or more second openings, a particle detector for detecting particles passed there-through, a modulator for modulating air flowing there-through, a pump for producing a first airstream flowing from the first opening and through the particle detector, and for producing a second airstream flowing through the modulator and to the one or more second openings, and control circuitry for controlling the modulator to modulate an amplitude of the second airstream.</description><language>eng</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; PHYSICS ; TESTING</subject><creationdate>2020</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20200728&amp;DB=EPODOC&amp;CC=US&amp;NR=10725061B2$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20200728&amp;DB=EPODOC&amp;CC=US&amp;NR=10725061B2$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Alston, William W</creatorcontrib><creatorcontrib>Browne, David</creatorcontrib><creatorcontrib>Lutz, Don</creatorcontrib><title>Modulated air surface particle detector</title><description>A device for counting particles on a sample surface includes a scanner probe having a first opening for receiving particles from a sample surface and one or more second openings, a particle detector for detecting particles passed there-through, a modulator for modulating air flowing there-through, a pump for producing a first airstream flowing from the first opening and through the particle detector, and for producing a second airstream flowing through the modulator and to the one or more second openings, and control circuitry for controlling the modulator to modulate an amplitude of the second airstream.</description><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2020</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZFD3zU8pzUksSU1RSMwsUiguLUpLTE5VKEgsKslMzklVSEktSU0uyS_iYWBNS8wpTuWF0twMim6uIc4euqkF-fGpxQVATXmpJfGhwYYG5kamBmaGTkbGxKgBAKsiKCA</recordid><startdate>20200728</startdate><enddate>20200728</enddate><creator>Alston, William W</creator><creator>Browne, David</creator><creator>Lutz, Don</creator><scope>EVB</scope></search><sort><creationdate>20200728</creationdate><title>Modulated air surface particle detector</title><author>Alston, William W ; Browne, David ; Lutz, Don</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US10725061B23</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2020</creationdate><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>Alston, William W</creatorcontrib><creatorcontrib>Browne, David</creatorcontrib><creatorcontrib>Lutz, Don</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Alston, William W</au><au>Browne, David</au><au>Lutz, Don</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Modulated air surface particle detector</title><date>2020-07-28</date><risdate>2020</risdate><abstract>A device for counting particles on a sample surface includes a scanner probe having a first opening for receiving particles from a sample surface and one or more second openings, a particle detector for detecting particles passed there-through, a modulator for modulating air flowing there-through, a pump for producing a first airstream flowing from the first opening and through the particle detector, and for producing a second airstream flowing through the modulator and to the one or more second openings, and control circuitry for controlling the modulator to modulate an amplitude of the second airstream.</abstract><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language eng
recordid cdi_epo_espacenet_US10725061B2
source esp@cenet
subjects INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
title Modulated air surface particle detector
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-18T17%3A07%3A46IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=Alston,%20William%20W&rft.date=2020-07-28&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS10725061B2%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true