Piezoelectric element

In a piezoelectric element, internal stress generated in an inactive portion at the time of sintering when a piezoelectric element is fabricated or stress applied from the outside to the inactive portion is absorbed by a recess of a lower surface of a first through hole conductor and a recess of an...

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Hauptverfasser: Ohta, Yoshiaki, Komatsu, Yuzo, Kezuka, Takahiro, Inaba, Katsuya, Ohta, Yoshiki, Inoue, Masayoshi, Sasaki, Satoshi, Sato, Rin, Tachimoto, Kazushi
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creator Ohta, Yoshiaki
Komatsu, Yuzo
Kezuka, Takahiro
Inaba, Katsuya
Ohta, Yoshiki
Inoue, Masayoshi
Sasaki, Satoshi
Sato, Rin
Tachimoto, Kazushi
description In a piezoelectric element, internal stress generated in an inactive portion at the time of sintering when a piezoelectric element is fabricated or stress applied from the outside to the inactive portion is absorbed by a recess of a lower surface of a first through hole conductor and a recess of an upper surface of a second through hole conductor. Accordingly, for example, deformation, rupture, or the like of the through hole conductor is prevented, and conduction failure or disconnection of an electrode layer or a through hole conductor is prevented. Further, in the inactive portion, since a protrusion of the piezoelectric layer enters the recess of the through hole conductor, a holding force of the piezoelectric layer with respect to the through hole conductor increases, and deformation of the through hole conductor is prevented or obstructed.
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US10707404B2</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US10707404B2</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US10707404B23</originalsourceid><addsrcrecordid>eNrjZBANyEytyk_NSU0uKcpMVgAyclPzSngYWNMSc4pTeaE0N4Oim2uIs4duakF-fGpxQWJyal5qSXxosKGBuYG5iYGJk5ExMWoAkJQheg</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Piezoelectric element</title><source>esp@cenet</source><creator>Ohta, Yoshiaki ; Komatsu, Yuzo ; Kezuka, Takahiro ; Inaba, Katsuya ; Ohta, Yoshiki ; Inoue, Masayoshi ; Sasaki, Satoshi ; Sato, Rin ; Tachimoto, Kazushi</creator><creatorcontrib>Ohta, Yoshiaki ; Komatsu, Yuzo ; Kezuka, Takahiro ; Inaba, Katsuya ; Ohta, Yoshiki ; Inoue, Masayoshi ; Sasaki, Satoshi ; Sato, Rin ; Tachimoto, Kazushi</creatorcontrib><description>In a piezoelectric element, internal stress generated in an inactive portion at the time of sintering when a piezoelectric element is fabricated or stress applied from the outside to the inactive portion is absorbed by a recess of a lower surface of a first through hole conductor and a recess of an upper surface of a second through hole conductor. Accordingly, for example, deformation, rupture, or the like of the through hole conductor is prevented, and conduction failure or disconnection of an electrode layer or a through hole conductor is prevented. Further, in the inactive portion, since a protrusion of the piezoelectric layer enters the recess of the through hole conductor, a holding force of the piezoelectric layer with respect to the through hole conductor increases, and deformation of the through hole conductor is prevented or obstructed.</description><language>eng</language><subject>ELECTRICITY</subject><creationdate>2020</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20200707&amp;DB=EPODOC&amp;CC=US&amp;NR=10707404B2$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20200707&amp;DB=EPODOC&amp;CC=US&amp;NR=10707404B2$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Ohta, Yoshiaki</creatorcontrib><creatorcontrib>Komatsu, Yuzo</creatorcontrib><creatorcontrib>Kezuka, Takahiro</creatorcontrib><creatorcontrib>Inaba, Katsuya</creatorcontrib><creatorcontrib>Ohta, Yoshiki</creatorcontrib><creatorcontrib>Inoue, Masayoshi</creatorcontrib><creatorcontrib>Sasaki, Satoshi</creatorcontrib><creatorcontrib>Sato, Rin</creatorcontrib><creatorcontrib>Tachimoto, Kazushi</creatorcontrib><title>Piezoelectric element</title><description>In a piezoelectric element, internal stress generated in an inactive portion at the time of sintering when a piezoelectric element is fabricated or stress applied from the outside to the inactive portion is absorbed by a recess of a lower surface of a first through hole conductor and a recess of an upper surface of a second through hole conductor. Accordingly, for example, deformation, rupture, or the like of the through hole conductor is prevented, and conduction failure or disconnection of an electrode layer or a through hole conductor is prevented. Further, in the inactive portion, since a protrusion of the piezoelectric layer enters the recess of the through hole conductor, a holding force of the piezoelectric layer with respect to the through hole conductor increases, and deformation of the through hole conductor is prevented or obstructed.</description><subject>ELECTRICITY</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2020</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZBANyEytyk_NSU0uKcpMVgAyclPzSngYWNMSc4pTeaE0N4Oim2uIs4duakF-fGpxQWJyal5qSXxosKGBuYG5iYGJk5ExMWoAkJQheg</recordid><startdate>20200707</startdate><enddate>20200707</enddate><creator>Ohta, Yoshiaki</creator><creator>Komatsu, Yuzo</creator><creator>Kezuka, Takahiro</creator><creator>Inaba, Katsuya</creator><creator>Ohta, Yoshiki</creator><creator>Inoue, Masayoshi</creator><creator>Sasaki, Satoshi</creator><creator>Sato, Rin</creator><creator>Tachimoto, Kazushi</creator><scope>EVB</scope></search><sort><creationdate>20200707</creationdate><title>Piezoelectric element</title><author>Ohta, Yoshiaki ; Komatsu, Yuzo ; Kezuka, Takahiro ; Inaba, Katsuya ; Ohta, Yoshiki ; Inoue, Masayoshi ; Sasaki, Satoshi ; Sato, Rin ; Tachimoto, Kazushi</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US10707404B23</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2020</creationdate><topic>ELECTRICITY</topic><toplevel>online_resources</toplevel><creatorcontrib>Ohta, Yoshiaki</creatorcontrib><creatorcontrib>Komatsu, Yuzo</creatorcontrib><creatorcontrib>Kezuka, Takahiro</creatorcontrib><creatorcontrib>Inaba, Katsuya</creatorcontrib><creatorcontrib>Ohta, Yoshiki</creatorcontrib><creatorcontrib>Inoue, Masayoshi</creatorcontrib><creatorcontrib>Sasaki, Satoshi</creatorcontrib><creatorcontrib>Sato, Rin</creatorcontrib><creatorcontrib>Tachimoto, Kazushi</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Ohta, Yoshiaki</au><au>Komatsu, Yuzo</au><au>Kezuka, Takahiro</au><au>Inaba, Katsuya</au><au>Ohta, Yoshiki</au><au>Inoue, Masayoshi</au><au>Sasaki, Satoshi</au><au>Sato, Rin</au><au>Tachimoto, Kazushi</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Piezoelectric element</title><date>2020-07-07</date><risdate>2020</risdate><abstract>In a piezoelectric element, internal stress generated in an inactive portion at the time of sintering when a piezoelectric element is fabricated or stress applied from the outside to the inactive portion is absorbed by a recess of a lower surface of a first through hole conductor and a recess of an upper surface of a second through hole conductor. Accordingly, for example, deformation, rupture, or the like of the through hole conductor is prevented, and conduction failure or disconnection of an electrode layer or a through hole conductor is prevented. Further, in the inactive portion, since a protrusion of the piezoelectric layer enters the recess of the through hole conductor, a holding force of the piezoelectric layer with respect to the through hole conductor increases, and deformation of the through hole conductor is prevented or obstructed.</abstract><oa>free_for_read</oa></addata></record>
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title Piezoelectric element
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-07T10%3A34%3A18IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=Ohta,%20Yoshiaki&rft.date=2020-07-07&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS10707404B2%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true