Three-dimensional memory device including locally thickened electrically conductive layers and methods of manufacturing the same

Fabricating a three-dimensional memory device may include forming an alternating stack of insulating layers and sacrificial material layers over a substrate. Stepped surfaces are formed by patterning the alternating stack. Sacrificial pads are formed on physically exposed horizontal surfaces of the...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: Otsu, Yoshitaka, Hojo, Naoto, Tabira, Takahiro
Format: Patent
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator Otsu, Yoshitaka
Hojo, Naoto
Tabira, Takahiro
description Fabricating a three-dimensional memory device may include forming an alternating stack of insulating layers and sacrificial material layers over a substrate. Stepped surfaces are formed by patterning the alternating stack. Sacrificial pads are formed on physically exposed horizontal surfaces of the sacrificial material layers. A retro-stepped dielectric material portion is formed over the sacrificial pads. After memory stack structures extending through the alternating stack are formed, the sacrificial material layers and the sacrificial pads can be replaced with replacement material portions that include electrically conductive layers. The electrically conductive layers can be formed with thicker end portions. Contact via structures can be formed on the thicker end portions.
format Patent
fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US10700089B1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US10700089B1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US10700089B13</originalsourceid><addsrcrecordid>eNqNjTsKwkAURdNYiLqH5wICCRZqqyj2xjo83tyYwfmE-QTSuXQVXYDVhcPh3HnxbPoAlEpbuKi9Y0MW1oeJFEYtIO3EZKXdnYwXNmai1Gt5wEERDCQF_cXincqS9AgyPCFEYqfesdR7Fcl3ZNnljiXl8KmlHhTZYlnMOjYRq98uivX51BwvJQbfIg4s76vU3q51ta2qarc_1Jt_nBfzd0qA</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Three-dimensional memory device including locally thickened electrically conductive layers and methods of manufacturing the same</title><source>esp@cenet</source><creator>Otsu, Yoshitaka ; Hojo, Naoto ; Tabira, Takahiro</creator><creatorcontrib>Otsu, Yoshitaka ; Hojo, Naoto ; Tabira, Takahiro</creatorcontrib><description>Fabricating a three-dimensional memory device may include forming an alternating stack of insulating layers and sacrificial material layers over a substrate. Stepped surfaces are formed by patterning the alternating stack. Sacrificial pads are formed on physically exposed horizontal surfaces of the sacrificial material layers. A retro-stepped dielectric material portion is formed over the sacrificial pads. After memory stack structures extending through the alternating stack are formed, the sacrificial material layers and the sacrificial pads can be replaced with replacement material portions that include electrically conductive layers. The electrically conductive layers can be formed with thicker end portions. Contact via structures can be formed on the thicker end portions.</description><language>eng</language><subject>BASIC ELECTRIC ELEMENTS ; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; SEMICONDUCTOR DEVICES</subject><creationdate>2020</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20200630&amp;DB=EPODOC&amp;CC=US&amp;NR=10700089B1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20200630&amp;DB=EPODOC&amp;CC=US&amp;NR=10700089B1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Otsu, Yoshitaka</creatorcontrib><creatorcontrib>Hojo, Naoto</creatorcontrib><creatorcontrib>Tabira, Takahiro</creatorcontrib><title>Three-dimensional memory device including locally thickened electrically conductive layers and methods of manufacturing the same</title><description>Fabricating a three-dimensional memory device may include forming an alternating stack of insulating layers and sacrificial material layers over a substrate. Stepped surfaces are formed by patterning the alternating stack. Sacrificial pads are formed on physically exposed horizontal surfaces of the sacrificial material layers. A retro-stepped dielectric material portion is formed over the sacrificial pads. After memory stack structures extending through the alternating stack are formed, the sacrificial material layers and the sacrificial pads can be replaced with replacement material portions that include electrically conductive layers. The electrically conductive layers can be formed with thicker end portions. Contact via structures can be formed on the thicker end portions.</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>SEMICONDUCTOR DEVICES</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2020</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNjTsKwkAURdNYiLqH5wICCRZqqyj2xjo83tyYwfmE-QTSuXQVXYDVhcPh3HnxbPoAlEpbuKi9Y0MW1oeJFEYtIO3EZKXdnYwXNmai1Gt5wEERDCQF_cXincqS9AgyPCFEYqfesdR7Fcl3ZNnljiXl8KmlHhTZYlnMOjYRq98uivX51BwvJQbfIg4s76vU3q51ta2qarc_1Jt_nBfzd0qA</recordid><startdate>20200630</startdate><enddate>20200630</enddate><creator>Otsu, Yoshitaka</creator><creator>Hojo, Naoto</creator><creator>Tabira, Takahiro</creator><scope>EVB</scope></search><sort><creationdate>20200630</creationdate><title>Three-dimensional memory device including locally thickened electrically conductive layers and methods of manufacturing the same</title><author>Otsu, Yoshitaka ; Hojo, Naoto ; Tabira, Takahiro</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US10700089B13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2020</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>SEMICONDUCTOR DEVICES</topic><toplevel>online_resources</toplevel><creatorcontrib>Otsu, Yoshitaka</creatorcontrib><creatorcontrib>Hojo, Naoto</creatorcontrib><creatorcontrib>Tabira, Takahiro</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Otsu, Yoshitaka</au><au>Hojo, Naoto</au><au>Tabira, Takahiro</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Three-dimensional memory device including locally thickened electrically conductive layers and methods of manufacturing the same</title><date>2020-06-30</date><risdate>2020</risdate><abstract>Fabricating a three-dimensional memory device may include forming an alternating stack of insulating layers and sacrificial material layers over a substrate. Stepped surfaces are formed by patterning the alternating stack. Sacrificial pads are formed on physically exposed horizontal surfaces of the sacrificial material layers. A retro-stepped dielectric material portion is formed over the sacrificial pads. After memory stack structures extending through the alternating stack are formed, the sacrificial material layers and the sacrificial pads can be replaced with replacement material portions that include electrically conductive layers. The electrically conductive layers can be formed with thicker end portions. Contact via structures can be formed on the thicker end portions.</abstract><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language eng
recordid cdi_epo_espacenet_US10700089B1
source esp@cenet
subjects BASIC ELECTRIC ELEMENTS
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
SEMICONDUCTOR DEVICES
title Three-dimensional memory device including locally thickened electrically conductive layers and methods of manufacturing the same
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-05T06%3A09%3A12IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=Otsu,%20Yoshitaka&rft.date=2020-06-30&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS10700089B1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true