Logic built in self test circuitry for use in an integrated circuit with scan chains

Aspects include a method for logic built-in self-testing (LBIST) for use in an integrated circuit with scan chains. The method includes programming a product control generator and a pattern generator with an LBIST pattern comprising at least a number of loops. The LBIST pattern is executed by genera...

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Bibliographische Detailangaben

Hauptverfasser:	Kusko, Mary P, Bhamidipati, Satya R. S, Gopalakrishnasetty, Raghu G, Lichtenau, Cedric
Format:	Patent
Sprache:	eng
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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