Selective recessing to form a fully aligned via

A method of forming a semiconductor device having a vertical metal line interconnect (via) fully aligned to a first direction of a first interconnect layer and a second direction of a second interconnect layer in a selective recess region by forming a plurality of metal lines in a first dielectric l...

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Bibliographische Detailangaben
Hauptverfasser: Standaert, Theodorus E, Lee, Joe, Huang, Elbert E, Briggs, Benjamin D, Dechene, Jessica
Format: Patent
Sprache:eng
Schlagworte:
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