Selection of corners and/or margins using statistical static timing analysis of an integrated circuit

Examples of techniques for statistical static timing analysis of an integrated circuit are disclosed. In one example according to aspects of the present disclosure, a computer-implemented method is provided. The method comprises performing an initial statistical static timing analysis of the integra...

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Bibliographische Detailangaben

Hauptverfasser:	Hemmett, Jeffrey G, Foreman, Eric A, Shuma, Stephen G, Schaeffer, Gregory M, Zolotov, Vladimir, Visweswariah, Chandramouli, Venkateswaran, Natesan, Kalafala, Kerim, Suess, Alexander J
Format:	Patent
Sprache:	eng
Online-Zugang:	Volltext bestellen
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