Probe pins with etched tips for electrical die test

A prober head to interface an E-testing apparatus to a device under test, which may be an unpackaged die, for example. In some embodiments, the prober head includes an array of conductive pins, each of the pins extending outwardly from a first pin end anchored to a substrate. At least a partial leng...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Xu, Dingying, Albertson, Todd P, Stanford, Joseph D, Mamodia, Mohit, Craig, David
Format:	Patent
Sprache:	eng
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!