On-die resistor measurement
Examples herein describe a die that includes a testing system (e.g., testing circuitry) for measuring the actual resistance of on-die resistors. When testing the die, an I/O element (e.g., a solder bump) can be used to sweep a voltage across the on-die resistor. The testing system identifies when th...
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| creator | Tan, Sing-Keng Tabalujan, Andrew Huang, Gubo Wang, Xiaobao |
| description | Examples herein describe a die that includes a testing system (e.g., testing circuitry) for measuring the actual resistance of on-die resistors. When testing the die, an I/O element (e.g., a solder bump) can be used to sweep a voltage across the on-die resistor. The testing system identifies when the voltage across the on-die resistor reaches a predefined reference voltage and measures the corresponding current. Using the measured current and the reference voltage, the testing system can identify the actual resistance of the on-die resistor. In one embodiment, the on-die resistor is tunable such if the on-die resistor has a divergent value, the die can adjust its resistance value to the desired value. |
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| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US10530324B1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US10530324B1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US10530324B13</originalsourceid><addsrcrecordid>eNrjZJD2z9NNyUxVKEotziwuyS9SyE1NLC4tSs1NzSvhYWBNS8wpTuWF0twMim6uIc4euqkF-fGpxQWJyal5qSXxocGGBqbGBsZGJk6GxsSoAQB--COV</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>On-die resistor measurement</title><source>esp@cenet</source><creator>Tan, Sing-Keng ; Tabalujan, Andrew ; Huang, Gubo ; Wang, Xiaobao</creator><creatorcontrib>Tan, Sing-Keng ; Tabalujan, Andrew ; Huang, Gubo ; Wang, Xiaobao</creatorcontrib><description>Examples herein describe a die that includes a testing system (e.g., testing circuitry) for measuring the actual resistance of on-die resistors. When testing the die, an I/O element (e.g., a solder bump) can be used to sweep a voltage across the on-die resistor. The testing system identifies when the voltage across the on-die resistor reaches a predefined reference voltage and measures the corresponding current. Using the measured current and the reference voltage, the testing system can identify the actual resistance of the on-die resistor. In one embodiment, the on-die resistor is tunable such if the on-die resistor has a divergent value, the die can adjust its resistance value to the desired value.</description><language>eng</language><subject>BASIC ELECTRIC ELEMENTS ; BASIC ELECTRONIC CIRCUITRY ; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS ; INFORMATION STORAGE ; MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; RESONATORS ; SEMICONDUCTOR DEVICES ; STATIC STORES ; TESTING</subject><creationdate>2020</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20200107&DB=EPODOC&CC=US&NR=10530324B1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25543,76293</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20200107&DB=EPODOC&CC=US&NR=10530324B1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Tan, Sing-Keng</creatorcontrib><creatorcontrib>Tabalujan, Andrew</creatorcontrib><creatorcontrib>Huang, Gubo</creatorcontrib><creatorcontrib>Wang, Xiaobao</creatorcontrib><title>On-die resistor measurement</title><description>Examples herein describe a die that includes a testing system (e.g., testing circuitry) for measuring the actual resistance of on-die resistors. When testing the die, an I/O element (e.g., a solder bump) can be used to sweep a voltage across the on-die resistor. The testing system identifies when the voltage across the on-die resistor reaches a predefined reference voltage and measures the corresponding current. Using the measured current and the reference voltage, the testing system can identify the actual resistance of the on-die resistor. In one embodiment, the on-die resistor is tunable such if the on-die resistor has a divergent value, the die can adjust its resistance value to the desired value.</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>BASIC ELECTRONIC CIRCUITRY</subject><subject>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS</subject><subject>INFORMATION STORAGE</subject><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>RESONATORS</subject><subject>SEMICONDUCTOR DEVICES</subject><subject>STATIC STORES</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2020</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZJD2z9NNyUxVKEotziwuyS9SyE1NLC4tSs1NzSvhYWBNS8wpTuWF0twMim6uIc4euqkF-fGpxQWJyal5qSXxocGGBqbGBsZGJk6GxsSoAQB--COV</recordid><startdate>20200107</startdate><enddate>20200107</enddate><creator>Tan, Sing-Keng</creator><creator>Tabalujan, Andrew</creator><creator>Huang, Gubo</creator><creator>Wang, Xiaobao</creator><scope>EVB</scope></search><sort><creationdate>20200107</creationdate><title>On-die resistor measurement</title><author>Tan, Sing-Keng ; Tabalujan, Andrew ; Huang, Gubo ; Wang, Xiaobao</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US10530324B13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2020</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>BASIC ELECTRONIC CIRCUITRY</topic><topic>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS</topic><topic>INFORMATION STORAGE</topic><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>RESONATORS</topic><topic>SEMICONDUCTOR DEVICES</topic><topic>STATIC STORES</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>Tan, Sing-Keng</creatorcontrib><creatorcontrib>Tabalujan, Andrew</creatorcontrib><creatorcontrib>Huang, Gubo</creatorcontrib><creatorcontrib>Wang, Xiaobao</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Tan, Sing-Keng</au><au>Tabalujan, Andrew</au><au>Huang, Gubo</au><au>Wang, Xiaobao</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>On-die resistor measurement</title><date>2020-01-07</date><risdate>2020</risdate><abstract>Examples herein describe a die that includes a testing system (e.g., testing circuitry) for measuring the actual resistance of on-die resistors. When testing the die, an I/O element (e.g., a solder bump) can be used to sweep a voltage across the on-die resistor. The testing system identifies when the voltage across the on-die resistor reaches a predefined reference voltage and measures the corresponding current. Using the measured current and the reference voltage, the testing system can identify the actual resistance of the on-die resistor. In one embodiment, the on-die resistor is tunable such if the on-die resistor has a divergent value, the die can adjust its resistance value to the desired value.</abstract><oa>free_for_read</oa></addata></record> |
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| subjects | BASIC ELECTRIC ELEMENTS BASIC ELECTRONIC CIRCUITRY ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS INFORMATION STORAGE MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS RESONATORS SEMICONDUCTOR DEVICES STATIC STORES TESTING |
| title | On-die resistor measurement |
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