Detecting structural integrity of a structural component
Each of a plurality electronic circuit devices fixed to a structural component of a physical structure can be scanned a first time, using a radio frequency (RF) scanner to receive, from each of the plurality of electronic circuit devices, first data indicating a first measured electrical impedance o...
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| creator | Hyre, Bruce H |
| description | Each of a plurality electronic circuit devices fixed to a structural component of a physical structure can be scanned a first time, using a radio frequency (RF) scanner to receive, from each of the plurality of electronic circuit devices, first data indicating a first measured electrical impedance of a respective conductor connected to the electronic circuit device and an identifier assigned to the electronic circuit device. For each of the plurality of electronic circuit devices, the first data indicating the first measured electrical impedance and the identifier assigned to the electronic circuit device can be stored to a first memory. The first data indicating the first measured electrical impedance and the identifier for each of the electronic devices can form a baseline measurement of the electronic circuit devices. |
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For each of the plurality of electronic circuit devices, the first data indicating the first measured electrical impedance and the identifier assigned to the electronic circuit device can be stored to a first memory. The first data indicating the first measured electrical impedance and the identifier for each of the electronic devices can form a baseline measurement of the electronic circuit devices.</description><language>eng</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; TESTING ; TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES ; TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR</subject><creationdate>2019</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20191231&DB=EPODOC&CC=US&NR=10520388B2$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25563,76418</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20191231&DB=EPODOC&CC=US&NR=10520388B2$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Hyre, Bruce H</creatorcontrib><title>Detecting structural integrity of a structural component</title><description>Each of a plurality electronic circuit devices fixed to a structural component of a physical structure can be scanned a first time, using a radio frequency (RF) scanner to receive, from each of the plurality of electronic circuit devices, first data indicating a first measured electrical impedance of a respective conductor connected to the electronic circuit device and an identifier assigned to the electronic circuit device. For each of the plurality of electronic circuit devices, the first data indicating the first measured electrical impedance and the identifier assigned to the electronic circuit device can be stored to a first memory. The first data indicating the first measured electrical impedance and the identifier for each of the electronic devices can form a baseline measurement of the electronic circuit devices.</description><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>TESTING</subject><subject>TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES</subject><subject>TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2019</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZLBwSS1JTS7JzEtXKC4pKk0uKS1KzFHIzCtJTS_KLKlUyE9TSESWSc7PLcjPS80r4WFgTUvMKU7lhdLcDIpuriHOHrqpBfnxqcUFicmpeakl8aHBhgamRgbGFhZORsbEqAEAZ18vOg</recordid><startdate>20191231</startdate><enddate>20191231</enddate><creator>Hyre, Bruce H</creator><scope>EVB</scope></search><sort><creationdate>20191231</creationdate><title>Detecting structural integrity of a structural component</title><author>Hyre, Bruce H</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US10520388B23</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2019</creationdate><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>TESTING</topic><topic>TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES</topic><topic>TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR</topic><toplevel>online_resources</toplevel><creatorcontrib>Hyre, Bruce H</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Hyre, Bruce H</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Detecting structural integrity of a structural component</title><date>2019-12-31</date><risdate>2019</risdate><abstract>Each of a plurality electronic circuit devices fixed to a structural component of a physical structure can be scanned a first time, using a radio frequency (RF) scanner to receive, from each of the plurality of electronic circuit devices, first data indicating a first measured electrical impedance of a respective conductor connected to the electronic circuit device and an identifier assigned to the electronic circuit device. For each of the plurality of electronic circuit devices, the first data indicating the first measured electrical impedance and the identifier assigned to the electronic circuit device can be stored to a first memory. The first data indicating the first measured electrical impedance and the identifier for each of the electronic devices can form a baseline measurement of the electronic circuit devices.</abstract><oa>free_for_read</oa></addata></record> |
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| language | eng |
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| subjects | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR |
| title | Detecting structural integrity of a structural component |
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