Retention-drift-history-based non-volatile memory read threshold optimization

Methods, systems and computer-readable storage media for selecting a retention drift predictor scheme, reading retention drift history associated with reference cells of a plurality of groups of pages of a non-volatile memory (NVM), and predicting values for an optimal read threshold voltage of at l...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Cohen, Earl T, Zhong, Hao
Format:	Patent
Sprache:	eng
Schlagworte:	INFORMATION STORAGE MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS STATIC STORES TESTING
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