Data processing system with built-in self-test and method therefor

A scan circuit and methods of operating a scan circuit are provided. The method for operating a scan circuit includes providing a first scan flip-flop which includes an overwrite feature. With the overwrite feature enabled, a change in functional behavior of the first scan flip-flop occurs based on...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Nappi, Chris P, Payne, Andrew H, MacDonald, Colin, Hoefler, Alexander B, Lyon, Jose A
Format:	Patent
Sprache:	eng
Schlagworte:	CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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