Optical addressing of individual targets in solids
This disclosure concerns photonics and in particular the addressing of individual targets in solids. In aspect one there is provided a device comprising a solid substrate with one or more atomic scale targets in the substrate. A laser light is focused on a region of the substrate that contains a sin...
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| creator | Yin, Chunming Rancic, Milos McCallum, Jeffrey Colin Sellars, Matthew John De Boo, Gabriele Gaetano Stavrias, Nikolas Rogge, Sven |
| description | This disclosure concerns photonics and in particular the addressing of individual targets in solids. In aspect one there is provided a device comprising a solid substrate with one or more atomic scale targets in the substrate. A laser light is focused on a region of the substrate that contains a single target to selectively cause photoionization of the target. A charge sensor with sub-electron charge sensitivity is focussed on measuring the charge in the region of the substrate that contains a single target. In use, the device operates such that the laser is turned on to cause photoionization of the target, and the charge sensor detects the change in charge in the region of the substrate that contains the single target. In another aspect is the method for optically investigating individual nuclear spin states of single atoms by investigating both the Zeeman effect and the hyperfine interaction of the single atoms. |
| format | Patent |
| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US10416216B2</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US10416216B2</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US10416216B23</originalsourceid><addsrcrecordid>eNrjZDDyLyjJTE7MUUhMSSlKLS7OzEtXyE9TyMxLySzLTCkFSpQkFqWnlhQDhRSK83MyU4p5GFjTEnOKU3mhNDeDoptriLOHbmpBfnxqcUFicmpeakl8aLChgYmhmZGhmZORMTFqANk7LEQ</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Optical addressing of individual targets in solids</title><source>esp@cenet</source><creator>Yin, Chunming ; Rancic, Milos ; McCallum, Jeffrey Colin ; Sellars, Matthew John ; De Boo, Gabriele Gaetano ; Stavrias, Nikolas ; Rogge, Sven</creator><creatorcontrib>Yin, Chunming ; Rancic, Milos ; McCallum, Jeffrey Colin ; Sellars, Matthew John ; De Boo, Gabriele Gaetano ; Stavrias, Nikolas ; Rogge, Sven</creatorcontrib><description>This disclosure concerns photonics and in particular the addressing of individual targets in solids. In aspect one there is provided a device comprising a solid substrate with one or more atomic scale targets in the substrate. A laser light is focused on a region of the substrate that contains a single target to selectively cause photoionization of the target. A charge sensor with sub-electron charge sensitivity is focussed on measuring the charge in the region of the substrate that contains a single target. In use, the device operates such that the laser is turned on to cause photoionization of the target, and the charge sensor detects the change in charge in the region of the substrate that contains the single target. In another aspect is the method for optically investigating individual nuclear spin states of single atoms by investigating both the Zeeman effect and the hyperfine interaction of the single atoms.</description><language>eng</language><subject>CALCULATING ; COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS ; COMPUTING ; COUNTING ; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES ; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES ; MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; NANOTECHNOLOGY ; PERFORMING OPERATIONS ; PHYSICS ; SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES ; TESTING ; TRANSPORTING</subject><creationdate>2019</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20190917&DB=EPODOC&CC=US&NR=10416216B2$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76290</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20190917&DB=EPODOC&CC=US&NR=10416216B2$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Yin, Chunming</creatorcontrib><creatorcontrib>Rancic, Milos</creatorcontrib><creatorcontrib>McCallum, Jeffrey Colin</creatorcontrib><creatorcontrib>Sellars, Matthew John</creatorcontrib><creatorcontrib>De Boo, Gabriele Gaetano</creatorcontrib><creatorcontrib>Stavrias, Nikolas</creatorcontrib><creatorcontrib>Rogge, Sven</creatorcontrib><title>Optical addressing of individual targets in solids</title><description>This disclosure concerns photonics and in particular the addressing of individual targets in solids. In aspect one there is provided a device comprising a solid substrate with one or more atomic scale targets in the substrate. A laser light is focused on a region of the substrate that contains a single target to selectively cause photoionization of the target. A charge sensor with sub-electron charge sensitivity is focussed on measuring the charge in the region of the substrate that contains a single target. In use, the device operates such that the laser is turned on to cause photoionization of the target, and the charge sensor detects the change in charge in the region of the substrate that contains the single target. In another aspect is the method for optically investigating individual nuclear spin states of single atoms by investigating both the Zeeman effect and the hyperfine interaction of the single atoms.</description><subject>CALCULATING</subject><subject>COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>MANUFACTURE OR TREATMENT OF NANOSTRUCTURES</subject><subject>MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES</subject><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>NANOTECHNOLOGY</subject><subject>PERFORMING OPERATIONS</subject><subject>PHYSICS</subject><subject>SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES</subject><subject>TESTING</subject><subject>TRANSPORTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2019</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZDDyLyjJTE7MUUhMSSlKLS7OzEtXyE9TyMxLySzLTCkFSpQkFqWnlhQDhRSK83MyU4p5GFjTEnOKU3mhNDeDoptriLOHbmpBfnxqcUFicmpeakl8aLChgYmhmZGhmZORMTFqANk7LEQ</recordid><startdate>20190917</startdate><enddate>20190917</enddate><creator>Yin, Chunming</creator><creator>Rancic, Milos</creator><creator>McCallum, Jeffrey Colin</creator><creator>Sellars, Matthew John</creator><creator>De Boo, Gabriele Gaetano</creator><creator>Stavrias, Nikolas</creator><creator>Rogge, Sven</creator><scope>EVB</scope></search><sort><creationdate>20190917</creationdate><title>Optical addressing of individual targets in solids</title><author>Yin, Chunming ; Rancic, Milos ; McCallum, Jeffrey Colin ; Sellars, Matthew John ; De Boo, Gabriele Gaetano ; Stavrias, Nikolas ; Rogge, Sven</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US10416216B23</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2019</creationdate><topic>CALCULATING</topic><topic>COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>MANUFACTURE OR TREATMENT OF NANOSTRUCTURES</topic><topic>MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES</topic><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>NANOTECHNOLOGY</topic><topic>PERFORMING OPERATIONS</topic><topic>PHYSICS</topic><topic>SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES</topic><topic>TESTING</topic><topic>TRANSPORTING</topic><toplevel>online_resources</toplevel><creatorcontrib>Yin, Chunming</creatorcontrib><creatorcontrib>Rancic, Milos</creatorcontrib><creatorcontrib>McCallum, Jeffrey Colin</creatorcontrib><creatorcontrib>Sellars, Matthew John</creatorcontrib><creatorcontrib>De Boo, Gabriele Gaetano</creatorcontrib><creatorcontrib>Stavrias, Nikolas</creatorcontrib><creatorcontrib>Rogge, Sven</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Yin, Chunming</au><au>Rancic, Milos</au><au>McCallum, Jeffrey Colin</au><au>Sellars, Matthew John</au><au>De Boo, Gabriele Gaetano</au><au>Stavrias, Nikolas</au><au>Rogge, Sven</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Optical addressing of individual targets in solids</title><date>2019-09-17</date><risdate>2019</risdate><abstract>This disclosure concerns photonics and in particular the addressing of individual targets in solids. In aspect one there is provided a device comprising a solid substrate with one or more atomic scale targets in the substrate. A laser light is focused on a region of the substrate that contains a single target to selectively cause photoionization of the target. A charge sensor with sub-electron charge sensitivity is focussed on measuring the charge in the region of the substrate that contains a single target. In use, the device operates such that the laser is turned on to cause photoionization of the target, and the charge sensor detects the change in charge in the region of the substrate that contains the single target. In another aspect is the method for optically investigating individual nuclear spin states of single atoms by investigating both the Zeeman effect and the hyperfine interaction of the single atoms.</abstract><oa>free_for_read</oa></addata></record> |
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| subjects | CALCULATING COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS COMPUTING COUNTING MANUFACTURE OR TREATMENT OF NANOSTRUCTURES MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES NANOTECHNOLOGY PERFORMING OPERATIONS PHYSICS SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES TESTING TRANSPORTING |
| title | Optical addressing of individual targets in solids |
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