Inspection apparatus, inspection system, inspection method, and recording medium

An inspection apparatus, system, and method, each of which: acquires a master image serving as an inspection reference, the master image being generated based on image data to be printed as a printed image; acquires a read image read from the printed image; extracts a neighboring region neighboring...

Ausführliche Beschreibung

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Bibliographische Detailangaben
1. Verfasser: Fukase, Takahiro
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:An inspection apparatus, system, and method, each of which: acquires a master image serving as an inspection reference, the master image being generated based on image data to be printed as a printed image; acquires a read image read from the printed image; extracts a neighboring region neighboring an edge region of the master image; determines whether a change amount of density of pixels in the neighboring region falls within a predetermined range; based on a determination that the change amount of density of pixels in the neighboring region falls within the predetermined range, calculates a statistic of density of pixels in a corresponding region of the read image, which corresponds to the neighboring region of the master image; and determines existence or non-existence of a defect in the corresponding region of the read image based on the statistic of the corresponding region.