Minimization of over-masking in an on product multiple input signature register (OPMISR)

Minimization of over-masking in an on product multiple input signature register (OPMISR)

A method and test circuit are provided for implementing enhanced scan data testing with minimization of over masking in an on product multiple input signature register (OPMISR) test, and a design structure on which the subject circuit resides. Common Channel Mask Scan Registers (CMSR) data is used w...

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Hauptverfasser: Schallhorn, Matthew B, Kusko, Mary P, Douskey, Steven M
Format: Patent
Sprache:eng
Schlagworte:
CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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creator Schallhorn, Matthew B
Kusko, Mary P
Douskey, Steven M
description A method and test circuit are provided for implementing enhanced scan data testing with minimization of over masking in an on product multiple input signature register (OPMISR) test, and a design structure on which the subject circuit resides. Common Channel Mask Scan Registers (CMSR) data is used with a multiple input signature register (MISR) in each satellite. A test algorithm control is used for implementing enhanced scan data testing by independently skewing scan unload shifting of selected OPMISR+ satellite by selected cycles. With this modified shifting, for the same test or a repeated run of the test, Channel Mask Enable (CME) triggered masking lines up on a different bit position in channels of each satellite avoiding over masking.
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subjects CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
title Minimization of over-masking in an on product multiple input signature register (OPMISR)
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