Automated TEM sample preparation

Techniques are described that facilitate automated extraction of lamellae and attaching the lamellae to sample grids for viewing on transmission electron microscopes. Some embodiments of the invention involve the use of machine vision to determine the positions of the lamella, the probe, and/or the...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Stone, Stacey, Trivedi, Dhruti, Brogden, Valerie, Young, Richard J, Miller, Thomas G, Templeton, Todd, Routh, Jr., Brian Roberts, Schmidt, Michael, Blackwood, Jeffrey
Format:	Patent
Sprache:	eng
Schlagworte:	BASIC ELECTRIC ELEMENTS ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS ELECTRICITY INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
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