Integrated circuit chip and a method for testing the same

An integrated circuit chip includes at least two integrated circuits, at least three scan chains, and a multiplexor circuitry. Each integrated circuit includes an integrated circuit input port and an integrated circuit output port. The scan chains and the integrated circuits are coupled by default w...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Krauch, Ulrich, Haller, Wilhelm, Kaltenbach, Markus, Zoellin, Christian, Maeding, Nicolas
Format:	Patent
Sprache:	eng
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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