Tunable ampere phase plate for charged particle imaging systems

Tunable ampere phase plate for charged particle imaging systems

A phase shifting device for a charged particle imaging system includes means for passing an electric current in a direction that has a nonzero component parallel to at least one section of the imaging beam. Preferably, the electric current is passed parallel along the section of the imaging beam. Th...

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Hauptverfasser: Savenko, Aleksei, Pozzi, Giulio, Tavabi, Amir Hossein, Dunin-Borkowski, Rafal Edward, Migunov, Vadim
Format: Patent
Sprache:eng
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BASIC ELECTRIC ELEMENTS
ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
ELECTRICITY
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creator Savenko, Aleksei
Pozzi, Giulio
Tavabi, Amir Hossein
Dunin-Borkowski, Rafal Edward
Migunov, Vadim
description A phase shifting device for a charged particle imaging system includes means for passing an electric current in a direction that has a nonzero component parallel to at least one section of the imaging beam. Preferably, the electric current is passed parallel along the section of the imaging beam. The amount of phase shift then centrosymmetrically depends on the distance between the electric current axis and the imaging beam axis. The magnetic field produced by the electric current exhibits the same effect on the phase of the beam as a localized charge according to the prior art.
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US10276345B2</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US10276345B2</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US10276345B23</originalsourceid><addsrcrecordid>eNrjZLAPKc1LTMpJVUjMLUgtSlUoyEgsBpI5iSWpCmn5RQrJGYlF6akpCgWJRSWZyUB1mbmJ6Zl56QrFlcUlqbnFPAysaYk5xam8UJqbQdHNNcTZQze1ID8-tbggMTk1L7UkPjTY0MDI3MzYxNTJyJgYNQCQPzEb</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Tunable ampere phase plate for charged particle imaging systems</title><source>esp@cenet</source><creator>Savenko, Aleksei ; Pozzi, Giulio ; Tavabi, Amir Hossein ; Dunin-Borkowski, Rafal Edward ; Migunov, Vadim</creator><creatorcontrib>Savenko, Aleksei ; Pozzi, Giulio ; Tavabi, Amir Hossein ; Dunin-Borkowski, Rafal Edward ; Migunov, Vadim</creatorcontrib><description>A phase shifting device for a charged particle imaging system includes means for passing an electric current in a direction that has a nonzero component parallel to at least one section of the imaging beam. Preferably, the electric current is passed parallel along the section of the imaging beam. The amount of phase shift then centrosymmetrically depends on the distance between the electric current axis and the imaging beam axis. The magnetic field produced by the electric current exhibits the same effect on the phase of the beam as a localized charge according to the prior art.</description><language>eng</language><subject>BASIC ELECTRIC ELEMENTS ; ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS ; ELECTRICITY</subject><creationdate>2019</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20190430&amp;DB=EPODOC&amp;CC=US&amp;NR=10276345B2$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20190430&amp;DB=EPODOC&amp;CC=US&amp;NR=10276345B2$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Savenko, Aleksei</creatorcontrib><creatorcontrib>Pozzi, Giulio</creatorcontrib><creatorcontrib>Tavabi, Amir Hossein</creatorcontrib><creatorcontrib>Dunin-Borkowski, Rafal Edward</creatorcontrib><creatorcontrib>Migunov, Vadim</creatorcontrib><title>Tunable ampere phase plate for charged particle imaging systems</title><description>A phase shifting device for a charged particle imaging system includes means for passing an electric current in a direction that has a nonzero component parallel to at least one section of the imaging beam. Preferably, the electric current is passed parallel along the section of the imaging beam. The amount of phase shift then centrosymmetrically depends on the distance between the electric current axis and the imaging beam axis. The magnetic field produced by the electric current exhibits the same effect on the phase of the beam as a localized charge according to the prior art.</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS</subject><subject>ELECTRICITY</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2019</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZLAPKc1LTMpJVUjMLUgtSlUoyEgsBpI5iSWpCmn5RQrJGYlF6akpCgWJRSWZyUB1mbmJ6Zl56QrFlcUlqbnFPAysaYk5xam8UJqbQdHNNcTZQze1ID8-tbggMTk1L7UkPjTY0MDI3MzYxNTJyJgYNQCQPzEb</recordid><startdate>20190430</startdate><enddate>20190430</enddate><creator>Savenko, Aleksei</creator><creator>Pozzi, Giulio</creator><creator>Tavabi, Amir Hossein</creator><creator>Dunin-Borkowski, Rafal Edward</creator><creator>Migunov, Vadim</creator><scope>EVB</scope></search><sort><creationdate>20190430</creationdate><title>Tunable ampere phase plate for charged particle imaging systems</title><author>Savenko, Aleksei ; Pozzi, Giulio ; Tavabi, Amir Hossein ; Dunin-Borkowski, Rafal Edward ; Migunov, Vadim</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US10276345B23</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2019</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS</topic><topic>ELECTRICITY</topic><toplevel>online_resources</toplevel><creatorcontrib>Savenko, Aleksei</creatorcontrib><creatorcontrib>Pozzi, Giulio</creatorcontrib><creatorcontrib>Tavabi, Amir Hossein</creatorcontrib><creatorcontrib>Dunin-Borkowski, Rafal Edward</creatorcontrib><creatorcontrib>Migunov, Vadim</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Savenko, Aleksei</au><au>Pozzi, Giulio</au><au>Tavabi, Amir Hossein</au><au>Dunin-Borkowski, Rafal Edward</au><au>Migunov, Vadim</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Tunable ampere phase plate for charged particle imaging systems</title><date>2019-04-30</date><risdate>2019</risdate><abstract>A phase shifting device for a charged particle imaging system includes means for passing an electric current in a direction that has a nonzero component parallel to at least one section of the imaging beam. Preferably, the electric current is passed parallel along the section of the imaging beam. The amount of phase shift then centrosymmetrically depends on the distance between the electric current axis and the imaging beam axis. The magnetic field produced by the electric current exhibits the same effect on the phase of the beam as a localized charge according to the prior art.</abstract><oa>free_for_read</oa></addata></record>
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subjects BASIC ELECTRIC ELEMENTS
ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
ELECTRICITY
title Tunable ampere phase plate for charged particle imaging systems
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-19T04%3A58%3A42IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=Savenko,%20Aleksei&rft.date=2019-04-30&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS10276345B2%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true