System for testing thermal response time of uncooled infrared focal plane detector array and method therefor

to obtain the thermal response time.

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Bibliographische Detailangaben
Hauptverfasser:	Zhao, Shengchen, Jiang, Yadong, Wang, Tao, Liang, Zhiqing, Zhang, Hongbo, Liu, Ziji
Format:	Patent
Sprache:	eng
Schlagworte:	COLORIMETRY MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS RADIATION PYROMETRY TESTING
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Beschreibung
Zusammenfassung:	to obtain the thermal response time.