Method for manufacturing SiC epitaxial wafer and SiC epitaxial wafer

In order to reduce edge defects efficiently and sufficiently, a method for manufacturing a SiC epitaxial wafer according to the present invention is a method for manufacturing a SiC epitaxial wafer that forms a SiC epitaxial layer on top of a SiC single crystal substrate having an off angle, and inc...

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Bibliographische Detailangaben
Hauptverfasser: Sugano, Susumu, Sasaki, Yuzo
Format: Patent
Sprache:eng
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