Multi-dimensional optimization of electrical parameters for memory training
Aspects of the embodiments are directed to systems, methods, and devices for generating a design of experiments (DOE) matrix, the DOE matrix comprising a set of possible combinations of values for a plurality of electrical parameters; iteratively applying each combination of values for the plurality...
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| creator | Uduebho, Oseghale O Norman, Adam J |
| description | Aspects of the embodiments are directed to systems, methods, and devices for generating a design of experiments (DOE) matrix, the DOE matrix comprising a set of possible combinations of values for a plurality of electrical parameters; iteratively applying each combination of values for the plurality of electrical parameters to one or more memory pins; determining a margin response for each combination of values; generating a prediction function based on a correlation of the margin response and each combination of values; and optimizing the plurality of electrical parameters based on the prediction function. |
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iteratively applying each combination of values for the plurality of electrical parameters to one or more memory pins; determining a margin response for each combination of values; generating a prediction function based on a correlation of the margin response and each combination of values; and optimizing the plurality of electrical parameters based on the prediction function.</description><language>eng</language><subject>CALCULATING ; COMPUTING ; COUNTING ; ELECTRIC DIGITAL DATA PROCESSING ; INFORMATION STORAGE ; PHYSICS ; STATIC STORES</subject><creationdate>2019</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20190416&DB=EPODOC&CC=US&NR=10262751B2$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20190416&DB=EPODOC&CC=US&NR=10262751B2$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Uduebho, Oseghale O</creatorcontrib><creatorcontrib>Norman, Adam J</creatorcontrib><title>Multi-dimensional optimization of electrical parameters for memory training</title><description>Aspects of the embodiments are directed to systems, methods, and devices for generating a design of experiments (DOE) matrix, the DOE matrix comprising a set of possible combinations of values for a plurality of electrical parameters; iteratively applying each combination of values for the plurality of electrical parameters to one or more memory pins; determining a margin response for each combination of values; generating a prediction function based on a correlation of the margin response and each combination of values; and optimizing the plurality of electrical parameters based on the prediction function.</description><subject>CALCULATING</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>ELECTRIC DIGITAL DATA PROCESSING</subject><subject>INFORMATION STORAGE</subject><subject>PHYSICS</subject><subject>STATIC STORES</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2019</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNijEKAjEQAK-xEPUP6wMOvIjaK4ogVmp9LHFzLCTZsFkLfb1X-ACrYZiZNpfrKxq3T06UK0vGCFKME3_QRgUJQJG8KfsxFVRMZKQVgigkSqJvMEXOnId5MwkYKy1-nDXL0_F-OLdUpKda0FMm6x-3buW2brfp9m79z_MF3UU2hQ</recordid><startdate>20190416</startdate><enddate>20190416</enddate><creator>Uduebho, Oseghale O</creator><creator>Norman, Adam J</creator><scope>EVB</scope></search><sort><creationdate>20190416</creationdate><title>Multi-dimensional optimization of electrical parameters for memory training</title><author>Uduebho, Oseghale O ; Norman, Adam J</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US10262751B23</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2019</creationdate><topic>CALCULATING</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>ELECTRIC DIGITAL DATA PROCESSING</topic><topic>INFORMATION STORAGE</topic><topic>PHYSICS</topic><topic>STATIC STORES</topic><toplevel>online_resources</toplevel><creatorcontrib>Uduebho, Oseghale O</creatorcontrib><creatorcontrib>Norman, Adam J</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Uduebho, Oseghale O</au><au>Norman, Adam J</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Multi-dimensional optimization of electrical parameters for memory training</title><date>2019-04-16</date><risdate>2019</risdate><abstract>Aspects of the embodiments are directed to systems, methods, and devices for generating a design of experiments (DOE) matrix, the DOE matrix comprising a set of possible combinations of values for a plurality of electrical parameters; iteratively applying each combination of values for the plurality of electrical parameters to one or more memory pins; determining a margin response for each combination of values; generating a prediction function based on a correlation of the margin response and each combination of values; and optimizing the plurality of electrical parameters based on the prediction function.</abstract><oa>free_for_read</oa></addata></record> |
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| subjects | CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING INFORMATION STORAGE PHYSICS STATIC STORES |
| title | Multi-dimensional optimization of electrical parameters for memory training |
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