Method of testing the resistance of a circuit to a side channel analysis

The present invention relates to a test method of a circuit, comprising: acquiring a plurality of value sets comprising values of a physical quantity linked to the activity of a circuit to be tested when the circuit executes an operation of a set of distinct cryptographic operations applied to a sec...

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Bibliographische Detailangaben
Hauptverfasser: Thiebeauld De La Crouee, Hugues, Clavier, Christophe, Wurcker, Antoine
Format: Patent
Sprache:eng
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