Low temperature thin wafer backside vacuum process with backgrinding tape

Vacuum processing, such as a backside metallization (BSM) deposition, is performed on a taped wafer after a gas escape path is formed between a base film of the tape and the wafer frontside surface following backgrind. Venting provided by the gas escape path reduces formation of bubbles under the ta...

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Bibliographische Detailangaben
1. Verfasser: Li, Eric J
Format: Patent
Sprache:eng
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