Laser scanning microscope and amplifier assembly
A laser scanning microscope for laser scanning a sample is provided. The laser scanning microscope includes a scanner that is operated at a predefined scanning speed and that is configured to change a direction of illumination light generated to illuminate the sample. A detector is configured to det...
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creator | Mueller, Martin Presser, Nico |
description | A laser scanning microscope for laser scanning a sample is provided. The laser scanning microscope includes a scanner that is operated at a predefined scanning speed and that is configured to change a direction of illumination light generated to illuminate the sample. A detector is configured to detect light that is returned from the sample and an amplifier assembly is connected to the detector and is configured to amplify a detection signal that is generated by the detector. The amplifier assembly includes an adjustable capacitor and a capacitance of the adjustable capacitor is adjusted depending on the scanning speed of the scanner. |
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The laser scanning microscope includes a scanner that is operated at a predefined scanning speed and that is configured to change a direction of illumination light generated to illuminate the sample. A detector is configured to detect light that is returned from the sample and an amplifier assembly is connected to the detector and is configured to amplify a detection signal that is generated by the detector. The amplifier assembly includes an adjustable capacitor and a capacitance of the adjustable capacitor is adjusted depending on the scanning speed of the scanner.</description><language>eng</language><subject>AMPLIFIERS ; BASIC ELECTRIC ELEMENTS ; BASIC ELECTRONIC CIRCUITRY ; COLORIMETRY ; CONTROL OF AMPLIFICATION ; ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS ; ELECTRICITY ; MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT ; MEASURING ; OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS ; OPTICS ; PHYSICS ; RADIATION PYROMETRY ; TESTING</subject><creationdate>2019</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20190108&DB=EPODOC&CC=US&NR=10175105B2$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76290</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20190108&DB=EPODOC&CC=US&NR=10175105B2$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Mueller, Martin</creatorcontrib><creatorcontrib>Presser, Nico</creatorcontrib><title>Laser scanning microscope and amplifier assembly</title><description>A laser scanning microscope for laser scanning a sample is provided. 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The amplifier assembly includes an adjustable capacitor and a capacitance of the adjustable capacitor is adjusted depending on the scanning speed of the scanner.</description><subject>AMPLIFIERS</subject><subject>BASIC ELECTRIC ELEMENTS</subject><subject>BASIC ELECTRONIC CIRCUITRY</subject><subject>COLORIMETRY</subject><subject>CONTROL OF AMPLIFICATION</subject><subject>ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS</subject><subject>ELECTRICITY</subject><subject>MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT</subject><subject>MEASURING</subject><subject>OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS</subject><subject>OPTICS</subject><subject>PHYSICS</subject><subject>RADIATION PYROMETRY</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2019</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZDDwSSxOLVIoTk7My8vMS1fIzUwuyi9Ozi9IVUjMS1FIzC3IyUzLBKpILC5OzU3KqeRhYE1LzClO5YXS3AyKbq4hzh66qQX58anFBYnJqXmpJfGhwYYGhuamhgamTkbGxKgBAHgSK5s</recordid><startdate>20190108</startdate><enddate>20190108</enddate><creator>Mueller, Martin</creator><creator>Presser, Nico</creator><scope>EVB</scope></search><sort><creationdate>20190108</creationdate><title>Laser scanning microscope and amplifier assembly</title><author>Mueller, Martin ; Presser, Nico</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US10175105B23</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2019</creationdate><topic>AMPLIFIERS</topic><topic>BASIC ELECTRIC ELEMENTS</topic><topic>BASIC ELECTRONIC CIRCUITRY</topic><topic>COLORIMETRY</topic><topic>CONTROL OF AMPLIFICATION</topic><topic>ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS</topic><topic>ELECTRICITY</topic><topic>MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT</topic><topic>MEASURING</topic><topic>OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS</topic><topic>OPTICS</topic><topic>PHYSICS</topic><topic>RADIATION PYROMETRY</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>Mueller, Martin</creatorcontrib><creatorcontrib>Presser, Nico</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Mueller, Martin</au><au>Presser, Nico</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Laser scanning microscope and amplifier assembly</title><date>2019-01-08</date><risdate>2019</risdate><abstract>A laser scanning microscope for laser scanning a sample is provided. The laser scanning microscope includes a scanner that is operated at a predefined scanning speed and that is configured to change a direction of illumination light generated to illuminate the sample. A detector is configured to detect light that is returned from the sample and an amplifier assembly is connected to the detector and is configured to amplify a detection signal that is generated by the detector. The amplifier assembly includes an adjustable capacitor and a capacitance of the adjustable capacitor is adjusted depending on the scanning speed of the scanner.</abstract><oa>free_for_read</oa></addata></record> |
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language | eng |
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subjects | AMPLIFIERS BASIC ELECTRIC ELEMENTS BASIC ELECTRONIC CIRCUITRY COLORIMETRY CONTROL OF AMPLIFICATION ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS ELECTRICITY MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT MEASURING OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS OPTICS PHYSICS RADIATION PYROMETRY TESTING |
title | Laser scanning microscope and amplifier assembly |
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