Control marker for implementing analysis methods on spots

The present invention relates to the use of a control marker for implementing analysis methods on spots, in particular in the context of multiplex analyses. The present invention thus relates to solid supports containing said control marker, their preparation method and their use in analysis methods...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Vedrine, Christophe Rene Roger, Doury, Vincent, Pouzet, Agnes Roseline Claude, Fournier, Laurent Emmanuel
Format:	Patent
Sprache:	eng
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
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