Maintaining the integrity of process conventions within an ALM framework

At least one ALM artifact, indexed by a unified data store, that does not comply with at least one process convention can be identified. Responsive to identifying the ALM artifact, indexed by the unified data store, that does not comply with the process convention, a determination can be made by a p...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Patterson, Scott R, Buquor, Mark T, Watts, Richard D, Garg, Vivek, Jarvis, Matthew P, Patel, Nimit K, Wells, Keith A, Akbulut, Muhtar B, Liman, David
Format:	Patent
Sprache:	eng
Schlagworte:	CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING PHYSICS
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