Integrated system and method for source/drain engineering

Implementations described herein generally provide a method of processing a substrate. Specifically, the methods described are used for cleaning and etching source/drain regions on a silicon substrate in preparation for precise Group IV source/drain growth in semiconductor devices. Benefits of this...

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Bibliographische Detailangaben
Hauptverfasser: Bao, Xinyu, Hon, Melitta Manyin, Chung, Hua, Yan, Chun, Chu, Schubert S
Format: Patent
Sprache:eng
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