Method and apparatus for dry gas phase chemically etching a structure

According to the invention there is provided a method of dry gas phase chemically etching a structure comprising the steps of: positioning the structure in an etch chamber, the structure comprising a first material and a second material, wherein the first material is selected from silicon, molybdenu...

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Hauptverfasser: Neumann, Jr., John Joseph, Lebouitz, Kyle Stanton
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creator Neumann, Jr., John Joseph
Lebouitz, Kyle Stanton
description According to the invention there is provided a method of dry gas phase chemically etching a structure comprising the steps of: positioning the structure in an etch chamber, the structure comprising a first material and a second material, wherein the first material is selected from silicon, molybdenum, germanium, SiGe and tungsten, the second material is silicon dioxide or silicon nitride, and at least one surface of the first material is exposed so as to be contactable by a gas phase chemical etchant; etching the first material with a noble gas fluoride or halogen fluoride gas phase chemical etchant; and exposing the etch chamber to water vapour so that the step of etching the first material is performed in the presence of water vapour.
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US10079150B2</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US10079150B2</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US10079150B23</originalsourceid><addsrcrecordid>eNrjZHD1TS3JyE9RSMwD4oKCxKLEktJihbT8IoWUokqF9MRihYKMxOJUheSM1NzM5MScnEqF1JLkjMy8dIVEheKSotLkktKiVB4G1rTEnOJUXijNzaDo5hri7KGbWpAfn1pckJicmpdaEh8abGhgYG5paGrgZGRMjBoA1kAzJA</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Method and apparatus for dry gas phase chemically etching a structure</title><source>esp@cenet</source><creator>Neumann, Jr., John Joseph ; Lebouitz, Kyle Stanton</creator><creatorcontrib>Neumann, Jr., John Joseph ; Lebouitz, Kyle Stanton</creatorcontrib><description>According to the invention there is provided a method of dry gas phase chemically etching a structure comprising the steps of: positioning the structure in an etch chamber, the structure comprising a first material and a second material, wherein the first material is selected from silicon, molybdenum, germanium, SiGe and tungsten, the second material is silicon dioxide or silicon nitride, and at least one surface of the first material is exposed so as to be contactable by a gas phase chemical etchant; etching the first material with a noble gas fluoride or halogen fluoride gas phase chemical etchant; and exposing the etch chamber to water vapour so that the step of etching the first material is performed in the presence of water vapour.</description><language>eng</language><subject>BASIC ELECTRIC ELEMENTS ; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; SEMICONDUCTOR DEVICES</subject><creationdate>2018</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20180918&amp;DB=EPODOC&amp;CC=US&amp;NR=10079150B2$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20180918&amp;DB=EPODOC&amp;CC=US&amp;NR=10079150B2$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Neumann, Jr., John Joseph</creatorcontrib><creatorcontrib>Lebouitz, Kyle Stanton</creatorcontrib><title>Method and apparatus for dry gas phase chemically etching a structure</title><description>According to the invention there is provided a method of dry gas phase chemically etching a structure comprising the steps of: positioning the structure in an etch chamber, the structure comprising a first material and a second material, wherein the first material is selected from silicon, molybdenum, germanium, SiGe and tungsten, the second material is silicon dioxide or silicon nitride, and at least one surface of the first material is exposed so as to be contactable by a gas phase chemical etchant; etching the first material with a noble gas fluoride or halogen fluoride gas phase chemical etchant; and exposing the etch chamber to water vapour so that the step of etching the first material is performed in the presence of water vapour.</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>SEMICONDUCTOR DEVICES</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2018</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZHD1TS3JyE9RSMwD4oKCxKLEktJihbT8IoWUokqF9MRihYKMxOJUheSM1NzM5MScnEqF1JLkjMy8dIVEheKSotLkktKiVB4G1rTEnOJUXijNzaDo5hri7KGbWpAfn1pckJicmpdaEh8abGhgYG5paGrgZGRMjBoA1kAzJA</recordid><startdate>20180918</startdate><enddate>20180918</enddate><creator>Neumann, Jr., John Joseph</creator><creator>Lebouitz, Kyle Stanton</creator><scope>EVB</scope></search><sort><creationdate>20180918</creationdate><title>Method and apparatus for dry gas phase chemically etching a structure</title><author>Neumann, Jr., John Joseph ; Lebouitz, Kyle Stanton</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US10079150B23</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2018</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>SEMICONDUCTOR DEVICES</topic><toplevel>online_resources</toplevel><creatorcontrib>Neumann, Jr., John Joseph</creatorcontrib><creatorcontrib>Lebouitz, Kyle Stanton</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Neumann, Jr., John Joseph</au><au>Lebouitz, Kyle Stanton</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Method and apparatus for dry gas phase chemically etching a structure</title><date>2018-09-18</date><risdate>2018</risdate><abstract>According to the invention there is provided a method of dry gas phase chemically etching a structure comprising the steps of: positioning the structure in an etch chamber, the structure comprising a first material and a second material, wherein the first material is selected from silicon, molybdenum, germanium, SiGe and tungsten, the second material is silicon dioxide or silicon nitride, and at least one surface of the first material is exposed so as to be contactable by a gas phase chemical etchant; etching the first material with a noble gas fluoride or halogen fluoride gas phase chemical etchant; and exposing the etch chamber to water vapour so that the step of etching the first material is performed in the presence of water vapour.</abstract><oa>free_for_read</oa></addata></record>
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subjects BASIC ELECTRIC ELEMENTS
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
SEMICONDUCTOR DEVICES
title Method and apparatus for dry gas phase chemically etching a structure
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-25T05%3A45%3A45IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=Neumann,%20Jr.,%20John%20Joseph&rft.date=2018-09-18&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS10079150B2%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true