Method for determining a position and orientation offset of a geodetic surveying device and such a surveying device

Method for precisely determining the position offset and orientation offset of a second deployment relative to a first deployment in the same measurement environment of a geodetic surveying device, in particular a total station or a theodolite, on the basis of directions, determined on the basis of...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: Toya, Stefan Martin Benjamin Gächter, Metzler, Bernhard
Format: Patent
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!