Differential probe with common-mode offset
A differential probe provides a probe input which comprises two inputs for recording a first and second input signal. The differential probe further provides a first amplifier which is connected to the two inputs. The differential probe additionally provides a compensation device, which generates an...
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| creator | Kunze, Alexander Ziegler, Andreas Krimmer, Roland Peschke, Martin |
| description | A differential probe provides a probe input which comprises two inputs for recording a first and second input signal. The differential probe further provides a first amplifier which is connected to the two inputs. The differential probe additionally provides a compensation device, which generates and superposes on the first and second input signal a differential offset signal. The compensation device also generates a common-mode offset signal which is independent of the differential offset signal. |
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| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US10031537B2</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US10031537B2</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US10031537B23</originalsourceid><addsrcrecordid>eNrjZNByyUxLSy1KzSvJTMxRKCjKT0pVKM8syVBIzs_Nzc_Tzc1PSVXIT0srTi3hYWBNS8wpTuWF0twMim6uIc4euqkF-fGpxQWJyal5qSXxocGGBgbGhqbG5k5GxsSoAQA7CCkw</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Differential probe with common-mode offset</title><source>esp@cenet</source><creator>Kunze, Alexander ; Ziegler, Andreas ; Krimmer, Roland ; Peschke, Martin</creator><creatorcontrib>Kunze, Alexander ; Ziegler, Andreas ; Krimmer, Roland ; Peschke, Martin</creatorcontrib><description>A differential probe provides a probe input which comprises two inputs for recording a first and second input signal. The differential probe further provides a first amplifier which is connected to the two inputs. The differential probe additionally provides a compensation device, which generates and superposes on the first and second input signal a differential offset signal. The compensation device also generates a common-mode offset signal which is independent of the differential offset signal.</description><language>eng</language><subject>CONTROLLING ; MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; REGULATING ; SYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES ; TESTING</subject><creationdate>2018</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20180724&DB=EPODOC&CC=US&NR=10031537B2$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76419</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20180724&DB=EPODOC&CC=US&NR=10031537B2$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Kunze, Alexander</creatorcontrib><creatorcontrib>Ziegler, Andreas</creatorcontrib><creatorcontrib>Krimmer, Roland</creatorcontrib><creatorcontrib>Peschke, Martin</creatorcontrib><title>Differential probe with common-mode offset</title><description>A differential probe provides a probe input which comprises two inputs for recording a first and second input signal. The differential probe further provides a first amplifier which is connected to the two inputs. The differential probe additionally provides a compensation device, which generates and superposes on the first and second input signal a differential offset signal. The compensation device also generates a common-mode offset signal which is independent of the differential offset signal.</description><subject>CONTROLLING</subject><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>REGULATING</subject><subject>SYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2018</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZNByyUxLSy1KzSvJTMxRKCjKT0pVKM8syVBIzs_Nzc_Tzc1PSVXIT0srTi3hYWBNS8wpTuWF0twMim6uIc4euqkF-fGpxQWJyal5qSXxocGGBgbGhqbG5k5GxsSoAQA7CCkw</recordid><startdate>20180724</startdate><enddate>20180724</enddate><creator>Kunze, Alexander</creator><creator>Ziegler, Andreas</creator><creator>Krimmer, Roland</creator><creator>Peschke, Martin</creator><scope>EVB</scope></search><sort><creationdate>20180724</creationdate><title>Differential probe with common-mode offset</title><author>Kunze, Alexander ; Ziegler, Andreas ; Krimmer, Roland ; Peschke, Martin</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US10031537B23</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2018</creationdate><topic>CONTROLLING</topic><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>REGULATING</topic><topic>SYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>Kunze, Alexander</creatorcontrib><creatorcontrib>Ziegler, Andreas</creatorcontrib><creatorcontrib>Krimmer, Roland</creatorcontrib><creatorcontrib>Peschke, Martin</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Kunze, Alexander</au><au>Ziegler, Andreas</au><au>Krimmer, Roland</au><au>Peschke, Martin</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Differential probe with common-mode offset</title><date>2018-07-24</date><risdate>2018</risdate><abstract>A differential probe provides a probe input which comprises two inputs for recording a first and second input signal. The differential probe further provides a first amplifier which is connected to the two inputs. The differential probe additionally provides a compensation device, which generates and superposes on the first and second input signal a differential offset signal. The compensation device also generates a common-mode offset signal which is independent of the differential offset signal.</abstract><oa>free_for_read</oa></addata></record> |
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| subjects | CONTROLLING MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS REGULATING SYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES TESTING |
| title | Differential probe with common-mode offset |
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