Total structural risk model

The present invention generally relates to financial data processing, and in particular it relates to credit scoring, consumer profiling, consumer behavior analysis and modeling. More specifically, it relates to risk modeling using the inputs of credit bureau data, size of wallet data, and, optional...

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Hauptverfasser: Xu, Di, Yuan, Chao, Choudhuri, Tirthankar, Dewan, Anjali, Gupta, Amber, Haggerty, Kathleen
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creator Xu, Di
Yuan, Chao
Choudhuri, Tirthankar
Dewan, Anjali
Gupta, Amber
Haggerty, Kathleen
description The present invention generally relates to financial data processing, and in particular it relates to credit scoring, consumer profiling, consumer behavior analysis and modeling. More specifically, it relates to risk modeling using the inputs of credit bureau data, size of wallet data, and, optionally, internal data.
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US10019757B2</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US10019757B2</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US10019757B23</originalsourceid><addsrcrecordid>eNrjZJAOyS9JzFEoLikqTS4pLQIyizKLsxVy81NSc3gYWNMSc4pTeaE0N4Oim2uIs4duakF-fGpxQWJyal5qSXxosKGBgaGluam5k5ExMWoAjE0juQ</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Total structural risk model</title><source>esp@cenet</source><creator>Xu, Di ; Yuan, Chao ; Choudhuri, Tirthankar ; Dewan, Anjali ; Gupta, Amber ; Haggerty, Kathleen</creator><creatorcontrib>Xu, Di ; Yuan, Chao ; Choudhuri, Tirthankar ; Dewan, Anjali ; Gupta, Amber ; Haggerty, Kathleen</creatorcontrib><description>The present invention generally relates to financial data processing, and in particular it relates to credit scoring, consumer profiling, consumer behavior analysis and modeling. More specifically, it relates to risk modeling using the inputs of credit bureau data, size of wallet data, and, optionally, internal data.</description><language>eng</language><subject>CALCULATING ; COMPUTING ; COUNTING ; DATA PROCESSING SYSTEMS OR METHODS, SPECIALLY ADAPTED FORADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORYOR FORECASTING PURPOSES ; PHYSICS ; SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE,COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORY OR FORECASTINGPURPOSES, NOT OTHERWISE PROVIDED FOR</subject><creationdate>2018</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20180710&amp;DB=EPODOC&amp;CC=US&amp;NR=10019757B2$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20180710&amp;DB=EPODOC&amp;CC=US&amp;NR=10019757B2$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Xu, Di</creatorcontrib><creatorcontrib>Yuan, Chao</creatorcontrib><creatorcontrib>Choudhuri, Tirthankar</creatorcontrib><creatorcontrib>Dewan, Anjali</creatorcontrib><creatorcontrib>Gupta, Amber</creatorcontrib><creatorcontrib>Haggerty, Kathleen</creatorcontrib><title>Total structural risk model</title><description>The present invention generally relates to financial data processing, and in particular it relates to credit scoring, consumer profiling, consumer behavior analysis and modeling. More specifically, it relates to risk modeling using the inputs of credit bureau data, size of wallet data, and, optionally, internal data.</description><subject>CALCULATING</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>DATA PROCESSING SYSTEMS OR METHODS, SPECIALLY ADAPTED FORADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORYOR FORECASTING PURPOSES</subject><subject>PHYSICS</subject><subject>SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE,COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORY OR FORECASTINGPURPOSES, NOT OTHERWISE PROVIDED FOR</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2018</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZJAOyS9JzFEoLikqTS4pLQIyizKLsxVy81NSc3gYWNMSc4pTeaE0N4Oim2uIs4duakF-fGpxQWJyal5qSXxosKGBgaGluam5k5ExMWoAjE0juQ</recordid><startdate>20180710</startdate><enddate>20180710</enddate><creator>Xu, Di</creator><creator>Yuan, Chao</creator><creator>Choudhuri, Tirthankar</creator><creator>Dewan, Anjali</creator><creator>Gupta, Amber</creator><creator>Haggerty, Kathleen</creator><scope>EVB</scope></search><sort><creationdate>20180710</creationdate><title>Total structural risk model</title><author>Xu, Di ; Yuan, Chao ; Choudhuri, Tirthankar ; Dewan, Anjali ; Gupta, Amber ; Haggerty, Kathleen</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US10019757B23</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2018</creationdate><topic>CALCULATING</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>DATA PROCESSING SYSTEMS OR METHODS, SPECIALLY ADAPTED FORADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORYOR FORECASTING PURPOSES</topic><topic>PHYSICS</topic><topic>SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE,COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORY OR FORECASTINGPURPOSES, NOT OTHERWISE PROVIDED FOR</topic><toplevel>online_resources</toplevel><creatorcontrib>Xu, Di</creatorcontrib><creatorcontrib>Yuan, Chao</creatorcontrib><creatorcontrib>Choudhuri, Tirthankar</creatorcontrib><creatorcontrib>Dewan, Anjali</creatorcontrib><creatorcontrib>Gupta, Amber</creatorcontrib><creatorcontrib>Haggerty, Kathleen</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Xu, Di</au><au>Yuan, Chao</au><au>Choudhuri, Tirthankar</au><au>Dewan, Anjali</au><au>Gupta, Amber</au><au>Haggerty, Kathleen</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Total structural risk model</title><date>2018-07-10</date><risdate>2018</risdate><abstract>The present invention generally relates to financial data processing, and in particular it relates to credit scoring, consumer profiling, consumer behavior analysis and modeling. More specifically, it relates to risk modeling using the inputs of credit bureau data, size of wallet data, and, optionally, internal data.</abstract><oa>free_for_read</oa></addata></record>
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subjects CALCULATING
COMPUTING
COUNTING
DATA PROCESSING SYSTEMS OR METHODS, SPECIALLY ADAPTED FORADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORYOR FORECASTING PURPOSES
PHYSICS
SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE,COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORY OR FORECASTINGPURPOSES, NOT OTHERWISE PROVIDED FOR
title Total structural risk model
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-28T08%3A48%3A30IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=Xu,%20Di&rft.date=2018-07-10&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS10019757B2%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true