Combined surface inspection using multiple scanners
Provided are methods and systems for inspecting surfaces of various components, such as evaluating height deviations on these surfaces. A method involves aggregating inspection data from multiple line scanners into a combined data set. This combined data set represents a portion of the surface that...
Gespeichert in:
| Hauptverfasser: | , , , |
|---|---|
| Format: | Patent |
| Sprache: | eng |
| Schlagworte: | |
| Online-Zugang: | Volltext bestellen |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | |
|---|---|
| container_issue | |
| container_start_page | |
| container_title | |
| container_volume | |
| creator | Bellavia, Christopher P Ingram, Luke C Baker, Anthony W Dorris, Steven A |
| description | Provided are methods and systems for inspecting surfaces of various components, such as evaluating height deviations on these surfaces. A method involves aggregating inspection data from multiple line scanners into a combined data set. This combined data set represents a portion of the surface that is larger than the field of measurement any one of the scanners. Furthermore, each pair of adjacent scanners operate at different periods of time to avoid interference. Because operating periods are offset, surface portions scanned by the pair of adjacent scanners can overlap without interference. This overlap of the scanned portions ensures that the entire surface is analyzed. The position of scanners relative to the inspection surface may be changed in between the scans and, in some embodiments, even during the scan. This approach allows precise scanning of large surfaces. |
| format | Patent |
| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US10018570B2</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US10018570B2</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US10018570B23</originalsourceid><addsrcrecordid>eNrjZDB2zs9NysxLTVEoLi1KS0xOVcjMKy5ITS7JzM9TKC3OzEtXyC3NKcksyElVKE5OzMtLLSrmYWBNS8wpTuWF0twMim6uIc4euqkF-fGpxQVAU_JSS-JDgw0NDAwtTM0NnIyMiVEDADgxLQ8</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Combined surface inspection using multiple scanners</title><source>esp@cenet</source><creator>Bellavia, Christopher P ; Ingram, Luke C ; Baker, Anthony W ; Dorris, Steven A</creator><creatorcontrib>Bellavia, Christopher P ; Ingram, Luke C ; Baker, Anthony W ; Dorris, Steven A</creatorcontrib><description>Provided are methods and systems for inspecting surfaces of various components, such as evaluating height deviations on these surfaces. A method involves aggregating inspection data from multiple line scanners into a combined data set. This combined data set represents a portion of the surface that is larger than the field of measurement any one of the scanners. Furthermore, each pair of adjacent scanners operate at different periods of time to avoid interference. Because operating periods are offset, surface portions scanned by the pair of adjacent scanners can overlap without interference. This overlap of the scanned portions ensures that the entire surface is analyzed. The position of scanners relative to the inspection surface may be changed in between the scans and, in some embodiments, even during the scan. This approach allows precise scanning of large surfaces.</description><language>eng</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; MEASURING ANGLES ; MEASURING AREAS ; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS ; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS ; PHYSICS ; TESTING</subject><creationdate>2018</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20180710&DB=EPODOC&CC=US&NR=10018570B2$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76290</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20180710&DB=EPODOC&CC=US&NR=10018570B2$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Bellavia, Christopher P</creatorcontrib><creatorcontrib>Ingram, Luke C</creatorcontrib><creatorcontrib>Baker, Anthony W</creatorcontrib><creatorcontrib>Dorris, Steven A</creatorcontrib><title>Combined surface inspection using multiple scanners</title><description>Provided are methods and systems for inspecting surfaces of various components, such as evaluating height deviations on these surfaces. A method involves aggregating inspection data from multiple line scanners into a combined data set. This combined data set represents a portion of the surface that is larger than the field of measurement any one of the scanners. Furthermore, each pair of adjacent scanners operate at different periods of time to avoid interference. Because operating periods are offset, surface portions scanned by the pair of adjacent scanners can overlap without interference. This overlap of the scanned portions ensures that the entire surface is analyzed. The position of scanners relative to the inspection surface may be changed in between the scans and, in some embodiments, even during the scan. This approach allows precise scanning of large surfaces.</description><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>MEASURING ANGLES</subject><subject>MEASURING AREAS</subject><subject>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</subject><subject>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2018</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZDB2zs9NysxLTVEoLi1KS0xOVcjMKy5ITS7JzM9TKC3OzEtXyC3NKcksyElVKE5OzMtLLSrmYWBNS8wpTuWF0twMim6uIc4euqkF-fGpxQVAU_JSS-JDgw0NDAwtTM0NnIyMiVEDADgxLQ8</recordid><startdate>20180710</startdate><enddate>20180710</enddate><creator>Bellavia, Christopher P</creator><creator>Ingram, Luke C</creator><creator>Baker, Anthony W</creator><creator>Dorris, Steven A</creator><scope>EVB</scope></search><sort><creationdate>20180710</creationdate><title>Combined surface inspection using multiple scanners</title><author>Bellavia, Christopher P ; Ingram, Luke C ; Baker, Anthony W ; Dorris, Steven A</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US10018570B23</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2018</creationdate><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>MEASURING ANGLES</topic><topic>MEASURING AREAS</topic><topic>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</topic><topic>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>Bellavia, Christopher P</creatorcontrib><creatorcontrib>Ingram, Luke C</creatorcontrib><creatorcontrib>Baker, Anthony W</creatorcontrib><creatorcontrib>Dorris, Steven A</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Bellavia, Christopher P</au><au>Ingram, Luke C</au><au>Baker, Anthony W</au><au>Dorris, Steven A</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Combined surface inspection using multiple scanners</title><date>2018-07-10</date><risdate>2018</risdate><abstract>Provided are methods and systems for inspecting surfaces of various components, such as evaluating height deviations on these surfaces. A method involves aggregating inspection data from multiple line scanners into a combined data set. This combined data set represents a portion of the surface that is larger than the field of measurement any one of the scanners. Furthermore, each pair of adjacent scanners operate at different periods of time to avoid interference. Because operating periods are offset, surface portions scanned by the pair of adjacent scanners can overlap without interference. This overlap of the scanned portions ensures that the entire surface is analyzed. The position of scanners relative to the inspection surface may be changed in between the scans and, in some embodiments, even during the scan. This approach allows precise scanning of large surfaces.</abstract><oa>free_for_read</oa></addata></record> |
| fulltext | fulltext_linktorsrc |
| identifier | |
| ispartof | |
| issn | |
| language | eng |
| recordid | cdi_epo_espacenet_US10018570B2 |
| source | esp@cenet |
| subjects | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING |
| title | Combined surface inspection using multiple scanners |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-31T14%3A14%3A08IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=Bellavia,%20Christopher%20P&rft.date=2018-07-10&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS10018570B2%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |