Electronic circuit and method to account for strain gauge variation

An apparatus utilizes multiple strain gauge ("SG") sensing units which are each disposed adjacent an inner surface of the device housing. Electrical voltage generated by the SGs is amplified by one or more amplifiers to maximize the resolution between a voltage output of an SG when in a no...

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Hauptverfasser: Cooper, James Aaron, Kwong, Kelvin, Mukherjee, Debanjan, Polyudov, Alexey, Sundara-Rajan, Kishore, Miller, James B, Quinn, Philip, Kugler, Tyler Reed
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creator Cooper, James Aaron
Kwong, Kelvin
Mukherjee, Debanjan
Polyudov, Alexey
Sundara-Rajan, Kishore
Miller, James B
Quinn, Philip
Kugler, Tyler Reed
description An apparatus utilizes multiple strain gauge ("SG") sensing units which are each disposed adjacent an inner surface of the device housing. Electrical voltage generated by the SGs is amplified by one or more amplifiers to maximize the resolution between a voltage output of an SG when in a non-pressed state and a voltage output of the SG when in a pressed state. Additionally, an electronic circuit is configured to identify a baseline voltage output for an SG over a period of time for comparing to a voltage output for the SG when the SG is in a pressed state such that the pressed state of the SG can be identified by the electronic circuit by comparing a current output voltage of the SG to the identified baseline voltage.
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US10013081B1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US10013081B1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US10013081B13</originalsourceid><addsrcrecordid>eNqNyjEOwjAMAMAsDAj4g_sApERdmKmKugNzZblusVTsKnF4PwsPYLrl9qHrVybPpkJAkqmKA-oEb_aXTeAGSGRVHWbLUDyjKCxYF4YPZkEX02PYzbgWPv08hObWP7rhzJuNXDYkVvbxeU8xpjZe0jW1_5wvfysyhQ</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Electronic circuit and method to account for strain gauge variation</title><source>esp@cenet</source><creator>Cooper, James Aaron ; Kwong, Kelvin ; Mukherjee, Debanjan ; Polyudov, Alexey ; Sundara-Rajan, Kishore ; Miller, James B ; Quinn, Philip ; Kugler, Tyler Reed</creator><creatorcontrib>Cooper, James Aaron ; Kwong, Kelvin ; Mukherjee, Debanjan ; Polyudov, Alexey ; Sundara-Rajan, Kishore ; Miller, James B ; Quinn, Philip ; Kugler, Tyler Reed</creatorcontrib><description>An apparatus utilizes multiple strain gauge ("SG") sensing units which are each disposed adjacent an inner surface of the device housing. Electrical voltage generated by the SGs is amplified by one or more amplifiers to maximize the resolution between a voltage output of an SG when in a non-pressed state and a voltage output of the SG when in a pressed state. Additionally, an electronic circuit is configured to identify a baseline voltage output for an SG over a period of time for comparing to a voltage output for the SG when the SG is in a pressed state such that the pressed state of the SG can be identified by the electronic circuit by comparing a current output voltage of the SG to the identified baseline voltage.</description><language>eng</language><subject>CALCULATING ; COMPUTING ; COUNTING ; ELECTRIC DIGITAL DATA PROCESSING ; PHYSICS</subject><creationdate>2018</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20180703&amp;DB=EPODOC&amp;CC=US&amp;NR=10013081B1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25563,76318</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20180703&amp;DB=EPODOC&amp;CC=US&amp;NR=10013081B1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Cooper, James Aaron</creatorcontrib><creatorcontrib>Kwong, Kelvin</creatorcontrib><creatorcontrib>Mukherjee, Debanjan</creatorcontrib><creatorcontrib>Polyudov, Alexey</creatorcontrib><creatorcontrib>Sundara-Rajan, Kishore</creatorcontrib><creatorcontrib>Miller, James B</creatorcontrib><creatorcontrib>Quinn, Philip</creatorcontrib><creatorcontrib>Kugler, Tyler Reed</creatorcontrib><title>Electronic circuit and method to account for strain gauge variation</title><description>An apparatus utilizes multiple strain gauge ("SG") sensing units which are each disposed adjacent an inner surface of the device housing. Electrical voltage generated by the SGs is amplified by one or more amplifiers to maximize the resolution between a voltage output of an SG when in a non-pressed state and a voltage output of the SG when in a pressed state. Additionally, an electronic circuit is configured to identify a baseline voltage output for an SG over a period of time for comparing to a voltage output for the SG when the SG is in a pressed state such that the pressed state of the SG can be identified by the electronic circuit by comparing a current output voltage of the SG to the identified baseline voltage.</description><subject>CALCULATING</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>ELECTRIC DIGITAL DATA PROCESSING</subject><subject>PHYSICS</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2018</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNyjEOwjAMAMAsDAj4g_sApERdmKmKugNzZblusVTsKnF4PwsPYLrl9qHrVybPpkJAkqmKA-oEb_aXTeAGSGRVHWbLUDyjKCxYF4YPZkEX02PYzbgWPv08hObWP7rhzJuNXDYkVvbxeU8xpjZe0jW1_5wvfysyhQ</recordid><startdate>20180703</startdate><enddate>20180703</enddate><creator>Cooper, James Aaron</creator><creator>Kwong, Kelvin</creator><creator>Mukherjee, Debanjan</creator><creator>Polyudov, Alexey</creator><creator>Sundara-Rajan, Kishore</creator><creator>Miller, James B</creator><creator>Quinn, Philip</creator><creator>Kugler, Tyler Reed</creator><scope>EVB</scope></search><sort><creationdate>20180703</creationdate><title>Electronic circuit and method to account for strain gauge variation</title><author>Cooper, James Aaron ; Kwong, Kelvin ; Mukherjee, Debanjan ; Polyudov, Alexey ; Sundara-Rajan, Kishore ; Miller, James B ; Quinn, Philip ; Kugler, Tyler Reed</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US10013081B13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2018</creationdate><topic>CALCULATING</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>ELECTRIC DIGITAL DATA PROCESSING</topic><topic>PHYSICS</topic><toplevel>online_resources</toplevel><creatorcontrib>Cooper, James Aaron</creatorcontrib><creatorcontrib>Kwong, Kelvin</creatorcontrib><creatorcontrib>Mukherjee, Debanjan</creatorcontrib><creatorcontrib>Polyudov, Alexey</creatorcontrib><creatorcontrib>Sundara-Rajan, Kishore</creatorcontrib><creatorcontrib>Miller, James B</creatorcontrib><creatorcontrib>Quinn, Philip</creatorcontrib><creatorcontrib>Kugler, Tyler Reed</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Cooper, James Aaron</au><au>Kwong, Kelvin</au><au>Mukherjee, Debanjan</au><au>Polyudov, Alexey</au><au>Sundara-Rajan, Kishore</au><au>Miller, James B</au><au>Quinn, Philip</au><au>Kugler, Tyler Reed</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Electronic circuit and method to account for strain gauge variation</title><date>2018-07-03</date><risdate>2018</risdate><abstract>An apparatus utilizes multiple strain gauge ("SG") sensing units which are each disposed adjacent an inner surface of the device housing. Electrical voltage generated by the SGs is amplified by one or more amplifiers to maximize the resolution between a voltage output of an SG when in a non-pressed state and a voltage output of the SG when in a pressed state. Additionally, an electronic circuit is configured to identify a baseline voltage output for an SG over a period of time for comparing to a voltage output for the SG when the SG is in a pressed state such that the pressed state of the SG can be identified by the electronic circuit by comparing a current output voltage of the SG to the identified baseline voltage.</abstract><oa>free_for_read</oa></addata></record>
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subjects CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
PHYSICS
title Electronic circuit and method to account for strain gauge variation
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-12T23%3A33%3A46IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=Cooper,%20James%20Aaron&rft.date=2018-07-03&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS10013081B1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true