Systems and methods for monitoring component strain

A system for monitoring a component is provided. The system may include a strain sensor configured on the component, an electrical field scanner for analyzing the strain sensor, and a processor in operable communication with the electrical field scanner. The processor may be operable for measuring a...

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Hauptverfasser:	Ranson, William F, Batzinger, Thomas James, Germann, Bryan J
Format:	Patent
Sprache:	eng
Schlagworte:	MEASURING MEASURING ANGLES MEASURING AREAS MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER,MECHANICAL EFFICIENCY, OR FLUID PRESSURE MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR
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creator	Ranson, William F Batzinger, Thomas James Germann, Bryan J
description	A system for monitoring a component is provided. The system may include a strain sensor configured on the component, an electrical field scanner for analyzing the strain sensor, and a processor in operable communication with the electrical field scanner. The processor may be operable for measuring an electrical field value across the strain sensor along a mutually-orthogonal X-axis and Y-axis to obtain a data point set. The processor may further be operable for assembling a field profile of the strain sensor based on the data point set. Methods of using the system are also provided.
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subjects	MEASURING MEASURING ANGLES MEASURING AREAS MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER,MECHANICAL EFFICIENCY, OR FLUID PRESSURE MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR
title	Systems and methods for monitoring component strain
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