Adjustment of measurement system components
One aspect provides a system, including: a sensor adjustment component having: a memory device having adjustment information stored therein; a light engine capable of producing a signal detectable by a light detector of an optical sensor to be adjusted; and one or more processors; where the one or m...
Gespeichert in:
Hauptverfasser: | , |
---|---|
Format: | Patent |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
container_end_page | |
---|---|
container_issue | |
container_start_page | |
container_title | |
container_volume | |
creator | Moin, Areef A Crook, David T |
description | One aspect provides a system, including: a sensor adjustment component having: a memory device having adjustment information stored therein; a light engine capable of producing a signal detectable by a light detector of an optical sensor to be adjusted; and one or more processors; where the one or more processors are configured to execute program instructions to operate the light engine to produce a predetermined light pattern detectable by the light detector of the optical sensor to be adjusted; where the predetermined signal pattern comprises the adjustment information; and where the adjustment information configures said light detector that receives said predetermined signal pattern carrying the adjustment information. Other aspects are disclosed. |
format | Patent |
fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US10006863B2</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US10006863B2</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US10006863B23</originalsourceid><addsrcrecordid>eNrjZNB2TMkqLS7JTc0rUchPU8hNTSwuLUoFc4sri0tScxWS83ML8vOAAsU8DKxpiTnFqbxQmptB0c01xNlDN7UgPz61uCAxOTUvtSQ-NNjQwMDAzMLM2MnImBg1AK2kKjs</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Adjustment of measurement system components</title><source>esp@cenet</source><creator>Moin, Areef A ; Crook, David T</creator><creatorcontrib>Moin, Areef A ; Crook, David T</creatorcontrib><description>One aspect provides a system, including: a sensor adjustment component having: a memory device having adjustment information stored therein; a light engine capable of producing a signal detectable by a light detector of an optical sensor to be adjusted; and one or more processors; where the one or more processors are configured to execute program instructions to operate the light engine to produce a predetermined light pattern detectable by the light detector of the optical sensor to be adjusted; where the predetermined signal pattern comprises the adjustment information; and where the adjustment information configures said light detector that receives said predetermined signal pattern carrying the adjustment information. Other aspects are disclosed.</description><language>eng</language><subject>ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS ; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE ; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR ; PHYSICS ; TARIFF METERING APPARATUS ; TESTING</subject><creationdate>2018</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20180626&DB=EPODOC&CC=US&NR=10006863B2$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20180626&DB=EPODOC&CC=US&NR=10006863B2$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Moin, Areef A</creatorcontrib><creatorcontrib>Crook, David T</creatorcontrib><title>Adjustment of measurement system components</title><description>One aspect provides a system, including: a sensor adjustment component having: a memory device having adjustment information stored therein; a light engine capable of producing a signal detectable by a light detector of an optical sensor to be adjusted; and one or more processors; where the one or more processors are configured to execute program instructions to operate the light engine to produce a predetermined light pattern detectable by the light detector of the optical sensor to be adjusted; where the predetermined signal pattern comprises the adjustment information; and where the adjustment information configures said light detector that receives said predetermined signal pattern carrying the adjustment information. Other aspects are disclosed.</description><subject>ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS</subject><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE</subject><subject>MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR</subject><subject>PHYSICS</subject><subject>TARIFF METERING APPARATUS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2018</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZNB2TMkqLS7JTc0rUchPU8hNTSwuLUoFc4sri0tScxWS83ML8vOAAsU8DKxpiTnFqbxQmptB0c01xNlDN7UgPz61uCAxOTUvtSQ-NNjQwMDAzMLM2MnImBg1AK2kKjs</recordid><startdate>20180626</startdate><enddate>20180626</enddate><creator>Moin, Areef A</creator><creator>Crook, David T</creator><scope>EVB</scope></search><sort><creationdate>20180626</creationdate><title>Adjustment of measurement system components</title><author>Moin, Areef A ; Crook, David T</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US10006863B23</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2018</creationdate><topic>ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS</topic><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE</topic><topic>MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR</topic><topic>PHYSICS</topic><topic>TARIFF METERING APPARATUS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>Moin, Areef A</creatorcontrib><creatorcontrib>Crook, David T</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Moin, Areef A</au><au>Crook, David T</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Adjustment of measurement system components</title><date>2018-06-26</date><risdate>2018</risdate><abstract>One aspect provides a system, including: a sensor adjustment component having: a memory device having adjustment information stored therein; a light engine capable of producing a signal detectable by a light detector of an optical sensor to be adjusted; and one or more processors; where the one or more processors are configured to execute program instructions to operate the light engine to produce a predetermined light pattern detectable by the light detector of the optical sensor to be adjusted; where the predetermined signal pattern comprises the adjustment information; and where the adjustment information configures said light detector that receives said predetermined signal pattern carrying the adjustment information. Other aspects are disclosed.</abstract><oa>free_for_read</oa></addata></record> |
fulltext | fulltext_linktorsrc |
identifier | |
ispartof | |
issn | |
language | eng |
recordid | cdi_epo_espacenet_US10006863B2 |
source | esp@cenet |
subjects | ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR PHYSICS TARIFF METERING APPARATUS TESTING |
title | Adjustment of measurement system components |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-28T08%3A17%3A36IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=Moin,%20Areef%20A&rft.date=2018-06-26&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS10006863B2%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |